TPS3307-18, TL1431, INA129, AM26LV31和32电子部件的最新单事件瞬变，扰流和锁紧测试结果

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI:10.1109/REDW51883.2020.9325851

J. Hatch, Brittany Butterworth

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引用次数: 0

摘要

汽车级零件为卫星和运载火箭的应用提供了商业“现货”(COTS)有源电子零件替代品。本文提出了重离子诱导的单事件效应(SEE)在各种汽车零部件中的测量结果，以供检验。汽车级零件在制造过程中对模具/晶圆的可追溯性提出了额外的挑战，并且在较小程度上对操作温度提出了挑战。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Recent Single Event Transients, Upsets, and Latchup Test Results for TPS3307-18, TL1431, INA129, AM26LV31 & 32 Electronic Parts

Automotive grade parts provide a commercial "off-the-shelf" (COTS) active electronic part alternative for application in satellite and launch vehicles. The results of heavy ion induced Single Event Effects (SEE) measured in various automotive parts are put forth for examination. Automotive grade parts provide additional challenge for die / wafer traceability in the fabrication process and, to a lesser extent, operational temperatures.

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来源期刊

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)

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