Recent Single Event Transients, Upsets, and Latchup Test Results for TPS3307-18, TL1431, INA129, AM26LV31 & 32 Electronic Parts

Abstract

Automotive grade parts provide a commercial "off-the-shelf" (COTS) active electronic part alternative for application in satellite and launch vehicles. The results of heavy ion induced Single Event Effects (SEE) measured in various automotive parts are put forth for examination. Automotive grade parts provide additional challenge for die / wafer traceability in the fabrication process and, to a lesser extent, operational temperatures.