Single Event Effects Characterization of Microchip’s Programmable Current Limiting Power Switch LX7712

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI:10.1109/REDW51883.2020.9325845

M. Leuenberger, M. Sureau, Russell Stevens, N. Rezzak, Dorian Johnson

引用次数: 2

Abstract

The Heavy Ions Single Event Effect characterization results of Microchip Technology’s radiation hardened programmable current limiting power switch IC, the LX7712, are presented. The data shown are based on Single Event campaign of November 2019.

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微芯片可编程限流电源开关LX7712的单事件效应表征

介绍了Microchip Technology的可编程限流电源开关IC LX7712的重离子单事件效应表征结果。所显示的数据是基于2019年11月的单事件活动。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)

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