2006 15th Asian Test Symposium最新文献_第5页

Verification Methodology for Self-Repairable Memory Systems 自修复记忆系统的验证方法

2006 15th Asian Test Symposium Pub Date : 2006-11-20 DOI: 10.1109/ATS.2006.87

Jin-Fu Li, Chun-Hsien Wu

引用次数: 0

Expansion of Convolutional Compactors over Galois Field 伽罗瓦域上卷积紧量的展开

2006 15th Asian Test Symposium Pub Date : 2006-11-20 DOI: 10.1109/ATS.2006.49

M. Arai, S. Fukumoto, K. Iwasaki

引用次数: 1

TOSCA: Total Scan Power Reduction Architecture based on Pseudo-Random Built-in Self Test Structure 基于伪随机内置自检结构的全扫描降功耗架构

2006 15th Asian Test Symposium Pub Date : 2006-11-20 DOI: 10.1109/ATS.2006.83

Youbean Kim, DongSup Song, Kicheol Kim, Incheol Kim, Sungho Kang

引用次数: 1

A Random Jitter Extraction Technique in the Presence of Sinusoidal Jitter 一种存在正弦抖动的随机抖动提取技术

2006 15th Asian Test Symposium Pub Date : 2006-11-20 DOI: 10.1109/ATS.2006.12

Jiun-Lang Huang

引用次数: 7

Fanout-based fault diagnosis for open faults on pass/fail information 基于通/不合格信息的开路故障诊断

2006 15th Asian Test Symposium Pub Date : 2006-11-20 DOI: 10.1109/ATS.2006.50

K. Yamazaki, Y. Takamatsu

引用次数: 1

An Efficient Test Pattern Selection Method for Improving Defect Coverage with Reduced Test Data Volume and Test Application Time 一种有效的测试模式选择方法，以减少测试数据量和测试应用时间来提高缺陷覆盖率

2006 15th Asian Test Symposium Pub Date : 2006-11-20 DOI: 10.1109/ATS.2006.21

Zhanglei Wang, K. Chakrabarty

引用次数: 22

Mentor Graphics DFT to Navigate Nanometer Test Challenges 导师图形DFT导航纳米测试挑战

2006 15th Asian Test Symposium Pub Date : 2006-11-20 DOI: 10.1109/ATS.2006.60

G. Aldrich, R. Press, Takeo Kobayashi, Tatsuo Sakajiri

引用次数: 0

A New Scan Design Technique Based on Pre-Synthesis Thru Functions 一种基于预合成通函数的扫描设计新技术

2006 15th Asian Test Symposium Pub Date : 2006-11-20 DOI: 10.1109/ATS.2006.11

C. Y. Ooi, H. Fujiwara

引用次数: 4

Detection of Interconnect Open Faults with Unknown Values by Ramp Voltage Application 应用斜坡电压检测未知值的互连断路故障

2006 15th Asian Test Symposium Pub Date : 2006-11-20 DOI: 10.1109/ATS.2006.39

Y. Miura

引用次数: 1

Early Life Cycle Yield Learning for Nanometer Devices Using Volume Yield Diagnostics Analysis 使用体积产率诊断分析的纳米器件早期生命周期产率学习

2006 15th Asian Test Symposium Pub Date : 2006-11-20 DOI: 10.1109/ATS.2006.45

Sanae Seike, Ken Namura, Y. Ohya, A. Uzzaman, Shinichi Arima, Dale Meehl, V. Chickermane, Azumi Kobayashi, S. Tanaka, Hiroyuki Adachi

{"title":"Early Life Cycle Yield Learning for Nanometer Devices Using Volume Yield Diagnostics Analysis","authors":"Sanae Seike, Ken Namura, Y. Ohya, A. Uzzaman, Shinichi Arima, Dale Meehl, V. Chickermane, Azumi Kobayashi, S. Tanaka, Hiroyuki Adachi","doi":"10.1109/ATS.2006.45","DOIUrl":"https://doi.org/10.1109/ATS.2006.45","url":null,"abstract":"As the industry fabricates devices with more on-chip circuitry using complex, advanced process technologies, the challenge to achieve satisfactory yield becomes more daunting (Madge, 2005). Leading-edge nanometer designs can be sensitive to inherent irregularity in sub-wavelength photolithography and variability in parametric characteristics often found in nanometer manufacturing environments. These factors often result in devices being fabricated with intermittent electrical performance problems. These types of systemic interactions (process-design) are the major factor in manufacturing yield loss in nanometer technology nodes. Failure diagnostics is being asked to identify these systemic defects, preferably during early product development, and provide enough information so that each defect is understood and can be addressed. This paper presents a case study, which empirically examines the challenges of achieving high yield during the early stage of wafer production with an examination of yield loss mechanisms. A proven methodology and model (volume yield diagnostics) for an economic justification enabling the timely identification of yield loss is discussed along with quick process methodology and analysis results based on real manufacturing data","PeriodicalId":242530,"journal":{"name":"2006 15th Asian Test Symposium","volume":"126 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128206789","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 4