基于伪随机内置自检结构的全扫描降功耗架构

2006 15th Asian Test Symposium Pub Date : 2006-11-20 DOI:10.1109/ATS.2006.83

Youbean Kim, DongSup Song, Kicheol Kim, Incheol Kim, Sungho Kang

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引用次数: 1

摘要

扫描操作功率是主要因素。本文提出了一种全面降低扫描功率的结构。总扫描功耗降低架构使用一个重复的过渡监控窗口和子扫描链。实验结果表明，TOSCA可以减少60%的过渡，提高2-4%的故障覆盖率，实现25%的扫描入和26%的扫描出过渡

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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TOSCA: Total Scan Power Reduction Architecture based on Pseudo-Random Built-in Self Test Structure

Power of scan operation is dominant factor. This paper proposed the structure to reduce scan power totally. The total scan power reduction architecture uses a duplicated transition monitoring window and sub-scan chains. Experimental results show 60% transition reduction, 2-4% fault coverage improvement, and 25% scan-in and 26% scan-out transition by the TOSCA

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2006 15th Asian Test Symposium

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