G. Aldrich, R. Press, Takeo Kobayashi, Tatsuo Sakajiri
{"title":"Mentor Graphics DFT to Navigate Nanometer Test Challenges","authors":"G. Aldrich, R. Press, Takeo Kobayashi, Tatsuo Sakajiri","doi":"10.1109/ATS.2006.60","DOIUrl":null,"url":null,"abstract":"Nanometer designs are getting smaller and bigger. Feature sizes are moving into nanometer geometries. Semiconductor companies creating these nanometer designs are struggling with many issues that result from this shrinking complex design environment. Mentor graphics design-for-test is committed to helping you navigate these challenges to bringing a high quality product to market while reducing test cost","PeriodicalId":242530,"journal":{"name":"2006 15th Asian Test Symposium","volume":"175 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 15th Asian Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2006.60","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Nanometer designs are getting smaller and bigger. Feature sizes are moving into nanometer geometries. Semiconductor companies creating these nanometer designs are struggling with many issues that result from this shrinking complex design environment. Mentor graphics design-for-test is committed to helping you navigate these challenges to bringing a high quality product to market while reducing test cost