Youbean Kim, DongSup Song, Kicheol Kim, Incheol Kim, Sungho Kang
{"title":"TOSCA: Total Scan Power Reduction Architecture based on Pseudo-Random Built-in Self Test Structure","authors":"Youbean Kim, DongSup Song, Kicheol Kim, Incheol Kim, Sungho Kang","doi":"10.1109/ATS.2006.83","DOIUrl":null,"url":null,"abstract":"Power of scan operation is dominant factor. This paper proposed the structure to reduce scan power totally. The total scan power reduction architecture uses a duplicated transition monitoring window and sub-scan chains. Experimental results show 60% transition reduction, 2-4% fault coverage improvement, and 25% scan-in and 26% scan-out transition by the TOSCA","PeriodicalId":242530,"journal":{"name":"2006 15th Asian Test Symposium","volume":"59 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 15th Asian Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2006.83","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Power of scan operation is dominant factor. This paper proposed the structure to reduce scan power totally. The total scan power reduction architecture uses a duplicated transition monitoring window and sub-scan chains. Experimental results show 60% transition reduction, 2-4% fault coverage improvement, and 25% scan-in and 26% scan-out transition by the TOSCA