TOSCA: Total Scan Power Reduction Architecture based on Pseudo-Random Built-in Self Test Structure

Youbean Kim, DongSup Song, Kicheol Kim, Incheol Kim, Sungho Kang
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引用次数: 1

Abstract

Power of scan operation is dominant factor. This paper proposed the structure to reduce scan power totally. The total scan power reduction architecture uses a duplicated transition monitoring window and sub-scan chains. Experimental results show 60% transition reduction, 2-4% fault coverage improvement, and 25% scan-in and 26% scan-out transition by the TOSCA
基于伪随机内置自检结构的全扫描降功耗架构
扫描操作功率是主要因素。本文提出了一种全面降低扫描功率的结构。总扫描功耗降低架构使用一个重复的过渡监控窗口和子扫描链。实验结果表明,TOSCA可以减少60%的过渡,提高2-4%的故障覆盖率,实现25%的扫描入和26%的扫描出过渡
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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