导师图形DFT导航纳米测试挑战

2006 15th Asian Test Symposium Pub Date : 2006-11-20 DOI:10.1109/ATS.2006.60

G. Aldrich, R. Press, Takeo Kobayashi, Tatsuo Sakajiri

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引用次数: 0

摘要

纳米设计正变得越来越小和越来越大。特征尺寸正在向纳米级几何形状发展。制造这些纳米设计的半导体公司正在努力解决由于这种缩小的复杂设计环境而导致的许多问题。Mentor图形测试设计致力于帮助您应对这些挑战，在降低测试成本的同时将高质量的产品推向市场

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Mentor Graphics DFT to Navigate Nanometer Test Challenges

Nanometer designs are getting smaller and bigger. Feature sizes are moving into nanometer geometries. Semiconductor companies creating these nanometer designs are struggling with many issues that result from this shrinking complex design environment. Mentor graphics design-for-test is committed to helping you navigate these challenges to bringing a high quality product to market while reducing test cost

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2006 15th Asian Test Symposium

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