Proceedings of 1993 IEEE International SOI Conference最新文献_第4页

Performance issues of SOI CMOS circuits at low supply voltages 低电源电压下SOI CMOS电路的性能问题

Proceedings of 1993 IEEE International SOI Conference Pub Date : 1993-10-05 DOI: 10.1109/SOI.1993.344572

H. Abel, G. Zimmer

引用次数: 0

Non-destructive characterization techniques for SOI substrates SOI衬底的无损表征技术

Proceedings of 1993 IEEE International SOI Conference Pub Date : 1993-10-05 DOI: 10.1109/SOI.1993.344602

H. Hovel, J. Freeouf, Kevin S. Beyer, D. Sadana, S. Chu

引用次数: 1

Conduction mechanisms through SIMOX buried oxide SIMOX埋地氧化物的传导机制

Proceedings of 1993 IEEE International SOI Conference Pub Date : 1993-10-05 DOI: 10.1109/SOI.1993.344604

J. Yap, T. Maung, J. Nee, E. Simic, J. E. Chung

引用次数: 2

CMOS/DMOS power IC technology on thin-film SOI substrates 薄膜SOI基板上的CMOS/DMOS功率IC技术

Proceedings of 1993 IEEE International SOI Conference Pub Date : 1993-10-05 DOI: 10.1109/SOI.1993.344543

G.M. Dolny, A. Ipri, M. Batty

引用次数: 2

A SiGe strain layer for gettering Fe in SIMOX SIMOX中Fe的SiGe应变层

Proceedings of 1993 IEEE International SOI Conference Pub Date : 1993-10-05 DOI: 10.1109/SOI.1993.344594

G. Campisi, P. Thompson, M. Anc, B. Cordts, D. Ioannou

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引用次数: 0

Improvement of the performances of SOI CMOS operational amplifiers by means of a gain-boosting stage 利用增益提升级提高SOI CMOS运算放大器的性能

Proceedings of 1993 IEEE International SOI Conference Pub Date : 1993-10-05 DOI: 10.1109/SOI.1993.344545

B. Gentinne, J. Colinge, P. Jespers, J. Eggermont

引用次数: 4

High performance submicron SOI/CMOS with an elevated source/drain structure 高性能亚微米SOI/CMOS与高架源/漏结构

Proceedings of 1993 IEEE International SOI Conference Pub Date : 1993-10-05 DOI: 10.1109/SOI.1993.344563

J. Hwang, E. Yee, T. Houston, G. Pollack

引用次数: 0

Electron trapping in SIMOX with supplemental implant SIMOX的电子捕获与补充植入物

Proceedings of 1993 IEEE International SOI Conference Pub Date : 1993-10-05 DOI: 10.1109/SOI.1993.344587

R. J. Lambert, T. Bhar, H. Hughes

引用次数: 0

A model for double snapback phenomena in N channel SOI MOSFETs N沟道SOI mosfet双回吸现象模型

Proceedings of 1993 IEEE International SOI Conference Pub Date : 1993-10-05 DOI: 10.1109/SOI.1993.344566

J.S.T. Huang

引用次数: 2

Self-heating effects on SOI devices and implication to parameter extraction SOI器件的自热效应及其对参数提取的启示

Proceedings of 1993 IEEE International SOI Conference Pub Date : 1993-10-05 DOI: 10.1109/SOI.1993.344557

D. Yachou, J. Gautier, C. Raynaud

引用次数: 6