Yash N. Doshi , Dixita S. Parmar , Ajay D. Zanpadiya , Aditi P. Pathak , Divya R. Solanki , Dimple V. Shah , Vishva M. Jain , Hiren N. Desai , Piyush B. Patel
{"title":"Expanding the potential of Zn0.15Sn0.85(Se0.95S0.05)2 crystals for applications in near-infrared optoelectronics, sensing, and Van der Waals heterojunctions","authors":"Yash N. Doshi , Dixita S. Parmar , Ajay D. Zanpadiya , Aditi P. Pathak , Divya R. Solanki , Dimple V. Shah , Vishva M. Jain , Hiren N. Desai , Piyush B. Patel","doi":"10.1016/j.sse.2025.109104","DOIUrl":"10.1016/j.sse.2025.109104","url":null,"abstract":"<div><div>Layered Zn<sub>0.15</sub>Sn<sub>0.85</sub>(Se<sub>0.95</sub>S<sub>0.05</sub>)<sub>2</sub> (Q2) crystals with a hexagonal crystalline structure were grown using the direct vapor transport technique (DVT). This research explores applications of the grown Q2 crystals as a near-infrared (NIR) photodetector, vacuum pressure sensor, and Van der Waals heterojunction. The NIR photodetector demonstrating stable, rapid switching with an improved responsivity of 153.38 mAW<sup>-1</sup>. A Q2 crystal-based NIR photodetector achieves an external quantum efficiency of 21.17 %. The Maxwellian distribution was applied to analysis trap depth of NIR photodetector. Additionally, the pulse resistive response of the Q2 crystal-based vacuum pressure sensor was evaluated across a vacuum pressure range from −1033 mbar to 0 mbar. The sensor exhibited a stable response, with 61.27 % at −1033 mbar and 5.85 % at −133 mbar with an average delay time of 2.99 s. Furthermore, the Van der Waals heterojunction device formed by the grown p-type Q2 crystals with another n-type quaternary crystal was studied using the thermionic-emission (TE) model. The ideality factors have been defined in the range of 1 to 2 by studying the current voltage (I-V) characteristics under different temperatures.</div></div>","PeriodicalId":21909,"journal":{"name":"Solid-state Electronics","volume":"226 ","pages":"Article 109104"},"PeriodicalIF":1.4,"publicationDate":"2025-03-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143642555","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Qingxue Zhao , Shenwei Wang , Zhengmao Wen , Weifang Zhang , Xiaoxia Duan , Lixin Yi
{"title":"Intense near-infrared electroluminescence properties from ZnO:Yb LED","authors":"Qingxue Zhao , Shenwei Wang , Zhengmao Wen , Weifang Zhang , Xiaoxia Duan , Lixin Yi","doi":"10.1016/j.sse.2025.109102","DOIUrl":"10.1016/j.sse.2025.109102","url":null,"abstract":"<div><div>Rare-earth (RE) doped zinc oxide electroluminescence is worthy of study due to its pure and sharp luminescence characteristics. In this work, we report ZnO:Yb light-emitting diodes (LED) and test their electroluminescence properties. Through adjusting the concentration of ytterbium doping and optimizing of annealing parameters for ZnO:Yb thin films, the results show that ZnO:Yb light-emitting diodes are capable of generating intense near-infrared emission at 975 nm and 1004 nm. We contend that impact excitation is the predominant mechanism underlying the electroluminescence in ITO/PEDOT:PSS/ZnO:Yb/n-Si light-emitting diodes. These results are considered an effective strategy for rare-earth-doped semiconductor electroluminescence in near-infrared light-emitting diodes.</div></div>","PeriodicalId":21909,"journal":{"name":"Solid-state Electronics","volume":"226 ","pages":"Article 109102"},"PeriodicalIF":1.4,"publicationDate":"2025-03-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143628006","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Y. Yan , M. Rack , M. Vanbrabant , M. Nabet , A. Goebel , P. Clifton , J.-P. Raskin
{"title":"Traps characterization in RF SOI substrates including a buried SiGe layer","authors":"Y. Yan , M. Rack , M. Vanbrabant , M. Nabet , A. Goebel , P. Clifton , J.-P. Raskin","doi":"10.1016/j.sse.2025.109103","DOIUrl":"10.1016/j.sse.2025.109103","url":null,"abstract":"<div><div>This work analyzes the interface traps density (<em>D</em><sub>it</sub>) at the SiO<sub>2</sub>/SiGe interface of a buried SiGe stressor SOI substrate, and demonstrates the impact of those traps on the effective resistivity (<em>ρ</em><sub>eff</sub>) of the substrate. The <em>C-V</em> behavior of MOS capacitors and the RF insertion loss along coplanar waveguide transmission lines on various substrates are measured. TCAD simulations are employed to interpret the traps characteristics and to forecast the RF performance of a buried SiGe stressor SOI wafer having a high resistivity handle Si substrate. The results demonstrate that thanks to the interface traps introduced by the SiGe layer the substrate effective resistivity (<em>ρ</em><sub>eff</sub>) is enhanced.</div></div>","PeriodicalId":21909,"journal":{"name":"Solid-state Electronics","volume":"226 ","pages":"Article 109103"},"PeriodicalIF":1.4,"publicationDate":"2025-03-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143620324","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
N. Aruna Kumari , Abhishek Kumar Upadhyay , Vikas Vijayvargiya , Gaurav Singh , Ankur Beohar , Prithvi P.
{"title":"An efficient temperature dependent compact model for nanosheet FET for neuromorphic computing circuit","authors":"N. Aruna Kumari , Abhishek Kumar Upadhyay , Vikas Vijayvargiya , Gaurav Singh , Ankur Beohar , Prithvi P.","doi":"10.1016/j.sse.2025.109096","DOIUrl":"10.1016/j.sse.2025.109096","url":null,"abstract":"<div><div>In this work, a temperature-dependent compact model is proposed for the three-sheet (3S) Nanosheet (NS) FET. This model is developed because a computationally efficient model is needed for large-scale circuit design. The model is based on the virtual source (VS) principle, which is chosen because for its simple mathematical formulation and minimal parameter requirements. This allows the model to accurately capture the performance characteristics of the 3S NSFET. The model is validated using TCAD results, which are well-calibrated with experimental data. It is then implemented in Verilog-A code for neuromorphic circuit simulations. Herein, we analyses the important parameters such as power, energy, and spiking frequency in NSFET-based leaky integrate-and-fire (LIF) neurons, with temperature variations. The results show that as the temperature increased from 25 °C to 125 °C, the spiking frequency increased by 36.64 %, due to higher current in the subthreshold operation of the device.</div></div>","PeriodicalId":21909,"journal":{"name":"Solid-state Electronics","volume":"227 ","pages":"Article 109096"},"PeriodicalIF":1.4,"publicationDate":"2025-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143855774","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Fucheng Wang , Mengmeng Chu , Jingwen Chen , Zhong Pan , Yongsang Kim , Jang kun Song , Muhammad Quddamah Khokhar , Junsin Yi
{"title":"Low power consumption of non-volatile memory device by tunneling process engineering","authors":"Fucheng Wang , Mengmeng Chu , Jingwen Chen , Zhong Pan , Yongsang Kim , Jang kun Song , Muhammad Quddamah Khokhar , Junsin Yi","doi":"10.1016/j.sse.2025.109100","DOIUrl":"10.1016/j.sse.2025.109100","url":null,"abstract":"<div><div>Compared with Si<sub>3</sub>N<sub>4</sub> and Al<sub>2</sub>O<sub>3</sub>, SiO<sub>2</sub> grown using thermal oxidation process as tunneling layer has the advantages of high bandgap and well interface contact with the surface of silicon wafer, which can be a great solution to the leakage current problem of metal–insulator-semiconductor (MIS) devices. This study investigates the effect of improving the SiO<sub>2</sub> tunnel layer on the operating voltage of MIS devices with a SiO<sub>2</sub>/HfAlO<sub>x</sub>/Al<sub>2</sub>O<sub>3</sub> structure. The result shows the operating voltage changes as the tunneling layer thickness decreases, with a minimum of only 12 V for a 1.5 nm tunneling layer thickness. In addition, we found that pinholes are generated on the film surface when annealing a 1.5 nm SiO<sub>2</sub> tunnel layer at 850 °C N<sub>2</sub>, in which case the operating voltage of the device is reduced to only 10 V, though it was also accompanied by the deterioration of the retention characteristics.</div></div>","PeriodicalId":21909,"journal":{"name":"Solid-state Electronics","volume":"226 ","pages":"Article 109100"},"PeriodicalIF":1.4,"publicationDate":"2025-03-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143627960","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Jaejoong Jeong , Youngkeun Park , Hwanuk Guim , Yongku Baek , Heetae Kim , Dongbin Kim , Hui Jae Cho , Su-hyeon Gwon , Min Ju Kim , Byung Jin Cho
{"title":"Selective grain size enlargement in Contact/Via plugs using Nanosecond green laser annealing","authors":"Jaejoong Jeong , Youngkeun Park , Hwanuk Guim , Yongku Baek , Heetae Kim , Dongbin Kim , Hui Jae Cho , Su-hyeon Gwon , Min Ju Kim , Byung Jin Cho","doi":"10.1016/j.sse.2025.109098","DOIUrl":"10.1016/j.sse.2025.109098","url":null,"abstract":"<div><div>The rapid decrease in interconnect Critical Dimensions (CDs) within logic devices and growth in the contact height of 3D memory devices have led to increased contact/via plugs resistance. In this study, we introduce an approach to reduce the resistance of the contact/via plugs by engineering the grain size of the plugs using Nanosecond Green Laser Annealing (NGLA) with a low energy fluence (= 0.1 J/cm<sup>2</sup>). Because of the proximity between adjacent W plugs, diffraction of the laser light can occur which will help the laser energy to be absorbed by the sidewall of the W plugs. In addition, the difference in reflectivity between the plug region and W interconnect lines can cause grain size enlargement to selectively occur in the plug region. The NGLA process increased grain size in the plugs up to 79.9 %, resulting as much as a 26 % reduction in tungsten plug resistance. The standard deviation of the plug resistance was also improved from 14.6 % to 7.9 % after the NGLA process.</div></div>","PeriodicalId":21909,"journal":{"name":"Solid-state Electronics","volume":"226 ","pages":"Article 109098"},"PeriodicalIF":1.4,"publicationDate":"2025-03-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143620325","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Q. Chen , L.Van Brandt , V. Kilchytska , E. Bestelink , R.A. Sporea , D. Flandre
{"title":"Low-frequency noise in polysilicon Source-Gated Thin-Film transistors","authors":"Q. Chen , L.Van Brandt , V. Kilchytska , E. Bestelink , R.A. Sporea , D. Flandre","doi":"10.1016/j.sse.2025.109099","DOIUrl":"10.1016/j.sse.2025.109099","url":null,"abstract":"<div><div>The low-frequency noise (LFN) of thin-film polysilicon source-gated transistors (SGTs) is investigated. DC characteristics were firstly measured and typical behaviors of SGT were observed. Then, TCAD simulations were performed with different doping concentrations. Current density distribution shows that the variation of the conduction channel position in the thin film induces a second plateau in the (<em>g</em><sub>m</sub>/<em>I</em><sub>D</sub>)<sup>2</sup> curves for bias points in subthreshold region. LFN was measured for both SGTs and thin-film field-effect transistor (TFTs) configurations. 1/<em>f</em> noise is confirmed as the main component of LFN in all our measurements. Carrier mobility fluctuation (CMF) is found to dominate the origin of LFN in TFT configuration and the low-current region of SGT. In the high-current region of SGT measurements, 1/<em>f</em> noise is mainly attributed to carrier number fluctuation (CNF).</div></div>","PeriodicalId":21909,"journal":{"name":"Solid-state Electronics","volume":"226 ","pages":"Article 109099"},"PeriodicalIF":1.4,"publicationDate":"2025-03-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143641913","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"High-endurance bulk CMOS one-transistor cryo-memory","authors":"A. Zaslavsky , P.R. Shrestha , V.Ortiz Jimenez , J.P. Campbell , C.A. Richter","doi":"10.1016/j.sse.2025.109097","DOIUrl":"10.1016/j.sse.2025.109097","url":null,"abstract":"<div><div>Previously we reported a compact one-transistor (1 T) 180 nm bulk CMOS cryo-memory with a high ≈10<sup>7</sup> <em>I</em><sub>1</sub>/<em>I</em><sub>0</sub> memory window and long ≈800 s retention time based on impact-ionization-induced charging of the transistor body. Here, we present the endurance and retention characteristics of our 1 T memory obtained from high-speed measurements at <em>T</em> = 7 K. We observe excellent endurance, with no visible degradation over 10<sup>9</sup> write ‘1′/write ‘0′ cycles. The measured retention time varies with the memory window and the leakage current, but it exceeds 10 s for a 30X <em>I</em><sub>1</sub>/<em>I</em><sub>0</sub> memory window and would be even higher in a device with no substrate contact.</div></div>","PeriodicalId":21909,"journal":{"name":"Solid-state Electronics","volume":"226 ","pages":"Article 109097"},"PeriodicalIF":1.4,"publicationDate":"2025-02-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143563058","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Jung Rae Cho , Jingyu Park , Seung Joo Myoung , Tae Jun Yang , Changwook Kim , Jong-Ho Bae , Sung-Jin Choi , Dong Myong Kim , Ickhyun Song , Dae Hwan Kim
{"title":"Investigation of reconfigurable logic gate using integrated amorphous InGaZnO ReRAM and thin-film transistor","authors":"Jung Rae Cho , Jingyu Park , Seung Joo Myoung , Tae Jun Yang , Changwook Kim , Jong-Ho Bae , Sung-Jin Choi , Dong Myong Kim , Ickhyun Song , Dae Hwan Kim","doi":"10.1016/j.sse.2025.109084","DOIUrl":"10.1016/j.sse.2025.109084","url":null,"abstract":"<div><div>This paper proposes a new reconfigurable logic circuits based on InGaZnO resistive random-access memory (ReRAM) and presents a comprehensive investigation of their electrical characteristics and logic operation. Two fundamental equations that govern the transport mechanism of oxygen ions were utilized to model the formation of lateral and vertical conducting filaments in ReRAM devices in a circuit simulation environment. Based on the device models, the electrical behavior of ReRAM was examined and verified, using circuit simulators. Experimental results from dc current–voltage and pulse measurements of ReRAM and thin-film transistors (TFTs) demonstrate their electrical switching characteristics. The paper analyzes and validates the operation of two ReRAM-based logic configurations: 1 T-1 M (one transistor and one ReRAM cell) and 2 T-2 M−INV (inverter). A detailed analysis were conducted to compare the proposed ReRAM-based logic with the conventional CMOS counterparts, revealing favorable advantages in reducing transistor counts and die areas. The 1 T-1 M and 2 T-2 M−INV exhibit reconfigurable logic operations under different resistive states of ReRAM cells. Additionally, the investigations of short-circuit current profiles shows the superior performance of ReRAM-based logic gates to the CMOS counterpart in terms of power consumption. Overall, this study investigates the feasibility of ReRAM-based reconfigurable logic circuits for future low-power and high-performance computing applications.</div></div>","PeriodicalId":21909,"journal":{"name":"Solid-state Electronics","volume":"226 ","pages":"Article 109084"},"PeriodicalIF":1.4,"publicationDate":"2025-02-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143487699","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Minqiang Liu , Xuqiang Liu , Guoping Xiao , Bobo Wang , Sanyong Zou , Le Zhong , Xianguo Xu , Chao Zeng , Shuyi Zhang , Guanghai Tang , Fang Deng , Abuduwayiti Aierken
{"title":"Comparison of radiation effects of LM and UMM structure GaAs triple-junction solar cells under 1 MeV neutron irradiation","authors":"Minqiang Liu , Xuqiang Liu , Guoping Xiao , Bobo Wang , Sanyong Zou , Le Zhong , Xianguo Xu , Chao Zeng , Shuyi Zhang , Guanghai Tang , Fang Deng , Abuduwayiti Aierken","doi":"10.1016/j.sse.2025.109087","DOIUrl":"10.1016/j.sse.2025.109087","url":null,"abstract":"<div><div>The output performances of lattice-matched (LM) and upright metamorphic (UMM) GaAs triple-junction solar cells under 1 MeV neutron irradiation were studied. The results show that the electrical performance, including open-circuit voltage, short-circuit current, maximum output power and fill factor of the solar cells were degraded seriously with the increase of neutron irradiation fluence. Meanwhile, the series resistance and the shunt resistance of solar cells are increased and decreased, respectively, when the neutron irradiation fluence increased. The degradation of maximum output power in LM and UMM GaAs cells is about the same level of 72.9 % and 72.3 % of its initial values, respectively, when the irradiation fluence is reached 6 × 10<sup>12</sup> n/cm<sup>2</sup>. By comparing the integrated current densities, it was found out that the current-limiting subcell in LM cells s always GaAs middle cell, and in the UMM cell, the current limiting unit is changed from GaInP top subcell to GaInAs middle subcell after high fluence neutron irradiation.</div></div>","PeriodicalId":21909,"journal":{"name":"Solid-state Electronics","volume":"226 ","pages":"Article 109087"},"PeriodicalIF":1.4,"publicationDate":"2025-02-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143437754","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}