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2016 IEEE Radiation Effects Data Workshop (REDW)最新文献

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On-Orbit measurements of TID and Dose Rate from two RADFETs on board NANOSAT-1B satellite 从NANOSAT-1B卫星上的两个radfet对TID和剂量率的在轨测量
2016 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 1900-01-01 DOI: 10.1109/NSREC.2016.7891725
M. Álvarez, P. Manzano, D. Escribano, C. Hernando, J. J. Jiménez, S. Sampedro, I. Arruego
{"title":"On-Orbit measurements of TID and Dose Rate from two RADFETs on board NANOSAT-1B satellite","authors":"M. Álvarez, P. Manzano, D. Escribano, C. Hernando, J. J. Jiménez, S. Sampedro, I. Arruego","doi":"10.1109/NSREC.2016.7891725","DOIUrl":"https://doi.org/10.1109/NSREC.2016.7891725","url":null,"abstract":"TID and Dose Rate data from 2 different RADFETs from Tyndall on board NANOSAT-1B from 2009 to the end of mission in July 2015 are presented. Data are in agreement with prediction models.","PeriodicalId":135325,"journal":{"name":"2016 IEEE Radiation Effects Data Workshop (REDW)","volume":"155 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117078446","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Laser Single Event Effects Response of Optek and Infineon Hall Effect Sensors Optek和英飞凌霍尔效应传感器的激光单事件效应响应
2016 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 1900-01-01 DOI: 10.1109/NSREC.2016.7891722
M. Newton, Haibin Wang, Li Chen, D. Hiemstra, V. Kirischian
{"title":"Laser Single Event Effects Response of Optek and Infineon Hall Effect Sensors","authors":"M. Newton, Haibin Wang, Li Chen, D. Hiemstra, V. Kirischian","doi":"10.1109/NSREC.2016.7891722","DOIUrl":"https://doi.org/10.1109/NSREC.2016.7891722","url":null,"abstract":"Single photon absorption laser single event effects test results for the Optek and Infineon Hall Effect Sensors are presented. The results are compared to previously published heavy ion data for the Optek sensor.","PeriodicalId":135325,"journal":{"name":"2016 IEEE Radiation Effects Data Workshop (REDW)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124530645","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Radiation Evaluation of the TPS7H3301-SP Linear Regulator for Double Data Rate (DDR) Applications 双数据速率(DDR)应用中TPS7H3301-SP线性稳压器的辐射评估
2016 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 1900-01-01 DOI: 10.1109/NSREC.2016.7891727
J. Cruz-Colon, M. Hamlyn, V. Zhu, B. A. Dahl, T. Trinh, R. Baumann
{"title":"Radiation Evaluation of the TPS7H3301-SP Linear Regulator for Double Data Rate (DDR) Applications","authors":"J. Cruz-Colon, M. Hamlyn, V. Zhu, B. A. Dahl, T. Trinh, R. Baumann","doi":"10.1109/NSREC.2016.7891727","DOIUrl":"https://doi.org/10.1109/NSREC.2016.7891727","url":null,"abstract":"Abstract- Single Events Effect (SEE) and Total Ionizing Dose (TID) results for a new Double Data Rate (DDR) linear voltage regulator are summarized, demonstrating robust SEE performance up to LETeff=65.1 MeV-cm2/mg and TID up to 100k Rads(Si).","PeriodicalId":135325,"journal":{"name":"2016 IEEE Radiation Effects Data Workshop (REDW)","volume":"200 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123017781","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Proton and Heavy Ion Sensitivity of Commercial Instrumentation and Precision Operational Amplifiers 商用仪器和精密运算放大器的质子和重离子灵敏度
2016 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 1900-01-01 DOI: 10.1109/NSREC.2016.7891726
S. Davis, R. Koga, J. George
{"title":"Proton and Heavy Ion Sensitivity of Commercial Instrumentation and Precision Operational Amplifiers","authors":"S. Davis, R. Koga, J. George","doi":"10.1109/NSREC.2016.7891726","DOIUrl":"https://doi.org/10.1109/NSREC.2016.7891726","url":null,"abstract":"Commercial operational amplifiers are common components in electronics in a high radiation environment such as for spacecraft. We performed proton and heavy-ion testing of selected commercial instrumentation and precision operational amplifiers. Based on these tests, we present cross section results for single event effects.","PeriodicalId":135325,"journal":{"name":"2016 IEEE Radiation Effects Data Workshop (REDW)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116281149","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Two Photon Absorption Laser Facility for Single Event Effect Testing 用于单事件效应测试的双光子吸收激光装置
2016 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 1900-01-01 DOI: 10.1109/NSREC.2016.7891751
M. Newton, Brook Danger, Haibin Wang, Li Chen, D. Hiemstra, V. Kirischian
{"title":"Two Photon Absorption Laser Facility for Single Event Effect Testing","authors":"M. Newton, Brook Danger, Haibin Wang, Li Chen, D. Hiemstra, V. Kirischian","doi":"10.1109/NSREC.2016.7891751","DOIUrl":"https://doi.org/10.1109/NSREC.2016.7891751","url":null,"abstract":"The laser facility for single event effect (SEE) testing at the Saskatchewan Structural Sciences Centre is introduced. Its capabilities of studying SEEs via two photon absorption (TPA) are described. Data on a Virtex-5 FPGA are provided.","PeriodicalId":135325,"journal":{"name":"2016 IEEE Radiation Effects Data Workshop (REDW)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116146737","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
SEL and TID Test Results on a Radiation Hardened Bus Switch Family 抗辐射母线开关系列的SEL和TID测试结果
2016 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 1900-01-01 DOI: 10.1109/NSREC.2016.7891735
M. Von Thun, Scott A Sapp, D. Walz, Rex Anderson, T. Farris
{"title":"SEL and TID Test Results on a Radiation Hardened Bus Switch Family","authors":"M. Von Thun, Scott A Sapp, D. Walz, Rex Anderson, T. Farris","doi":"10.1109/NSREC.2016.7891735","DOIUrl":"https://doi.org/10.1109/NSREC.2016.7891735","url":null,"abstract":"The SEL and TID test results are presented for the Cobham radiation hardened bus switch family of products. The device is SEL immune to an effective LET ≤ 100 MeV·cm2/mg and TID qualified to 300krad(Si).","PeriodicalId":135325,"journal":{"name":"2016 IEEE Radiation Effects Data Workshop (REDW)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121244524","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Single Event Effects Testing of the Hardened Texas Instruments MSP430FR5739 Microcontroller on with Embedded Ferroelectric Memory 硬化德州仪器MSP430FR5739微控制器在嵌入式铁电存储器上的单事件效应测试
2016 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 1900-01-01 DOI: 10.1109/NSREC.2016.7891740
James Aarestad, Paul Eaton, Will Burke, D. Alexander, J. Salzman
{"title":"Single Event Effects Testing of the Hardened Texas Instruments MSP430FR5739 Microcontroller on with Embedded Ferroelectric Memory","authors":"James Aarestad, Paul Eaton, Will Burke, D. Alexander, J. Salzman","doi":"10.1109/NSREC.2016.7891740","DOIUrl":"https://doi.org/10.1109/NSREC.2016.7891740","url":null,"abstract":"MSP430FR55739 tests at the Lawrence Berkeley National Laboratory (LBNL) Cyclotron used the Milli-Beam apparatus to restrict exposure to specific blocks. Instruction lockstep techniques were employed to synchronize test unit outputs with an unexposed device. In this paper, we present cross-sections for the device and functional blocks.","PeriodicalId":135325,"journal":{"name":"2016 IEEE Radiation Effects Data Workshop (REDW)","volume":"64 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132946916","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Single Event Effects Characterization of TI ADS1282-SP High Resolution ADC TI ADS1282-SP高分辨率ADC的单事件效应表征
2016 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 1900-01-01 DOI: 10.1109/NSREC.2016.7891737
S. Narayanan, W. Vonbergen, J. Cruz-Colon, V. Narayanan
{"title":"Single Event Effects Characterization of TI ADS1282-SP High Resolution ADC","authors":"S. Narayanan, W. Vonbergen, J. Cruz-Colon, V. Narayanan","doi":"10.1109/NSREC.2016.7891737","DOIUrl":"https://doi.org/10.1109/NSREC.2016.7891737","url":null,"abstract":"The single event effects behavior of the ADS1282- SP, a high dynamic range ADC, are presented. No latch up events were detected up to an LET of 50.5 MeV.cm2/mg at 85 °C and 125 °C. No latch up events detected up to an LET of 60.4 MeV.cm2/mg at 85 °C.","PeriodicalId":135325,"journal":{"name":"2016 IEEE Radiation Effects Data Workshop (REDW)","volume":"99 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134064323","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Single-Event Upsets Characterization & Evaluation of Xilinx UltraScale™ Soft Error Mitigation (SEM IP) Tool 单一事件颠覆人物塑造Xilinx UltraScale&#8482的评价软错误缓解(SEM IP)工具
2016 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 1900-01-01 DOI: 10.1109/NSREC.2016.7891745
P. Maillard, M. Hart, Jeff Barton, Paula Chang, Michael Welter, Robert Le, R. Ismail, Eric Crabill
{"title":"Single-Event Upsets Characterization & Evaluation of Xilinx UltraScale™ Soft Error Mitigation (SEM IP) Tool","authors":"P. Maillard, M. Hart, Jeff Barton, Paula Chang, Michael Welter, Robert Le, R. Ismail, Eric Crabill","doi":"10.1109/NSREC.2016.7891745","DOIUrl":"https://doi.org/10.1109/NSREC.2016.7891745","url":null,"abstract":"This paper examines the single-event upset response of the Xilinx UltraScale Soft Error Mitigation (SEM IP) software tool irradiated with a 64MeV proton source. The SEM SEU results are then compared to accelerated particle testing results for the Xilinx 20nm Kintex family, collected at LANSCE and Crocker, to evaluate its capability to detect & collect SEU accurately. Furthermore, Xilinx 20nm stacked silicon on interposer (SSI) technology SEU response is characterized. SEU and MBU results are presented.","PeriodicalId":135325,"journal":{"name":"2016 IEEE Radiation Effects Data Workshop (REDW)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132820322","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Compendium of Ball Aerospace TID and SEE Test Results Ball Aerospace TID和SEE测试结果汇编
2016 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 1900-01-01 DOI: 10.1109/nsrec.2016.7891705
T. Oldham, Jennifer Lee
{"title":"Compendium of Ball Aerospace TID and SEE Test Results","authors":"T. Oldham, Jennifer Lee","doi":"10.1109/nsrec.2016.7891705","DOIUrl":"https://doi.org/10.1109/nsrec.2016.7891705","url":null,"abstract":"We have conducted a TID and SEE tests on a variety of parts intended for application in different Ball Aerospace systems. Results and discussion are presented.","PeriodicalId":135325,"journal":{"name":"2016 IEEE Radiation Effects Data Workshop (REDW)","volume":"82 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115117751","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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