S. Narayanan, W. Vonbergen, J. Cruz-Colon, V. Narayanan
{"title":"TI ADS1282-SP高分辨率ADC的单事件效应表征","authors":"S. Narayanan, W. Vonbergen, J. Cruz-Colon, V. Narayanan","doi":"10.1109/NSREC.2016.7891737","DOIUrl":null,"url":null,"abstract":"The single event effects behavior of the ADS1282- SP, a high dynamic range ADC, are presented. No latch up events were detected up to an LET of 50.5 MeV.cm2/mg at 85 °C and 125 °C. No latch up events detected up to an LET of 60.4 MeV.cm2/mg at 85 °C.","PeriodicalId":135325,"journal":{"name":"2016 IEEE Radiation Effects Data Workshop (REDW)","volume":"99 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Single Event Effects Characterization of TI ADS1282-SP High Resolution ADC\",\"authors\":\"S. Narayanan, W. Vonbergen, J. Cruz-Colon, V. Narayanan\",\"doi\":\"10.1109/NSREC.2016.7891737\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The single event effects behavior of the ADS1282- SP, a high dynamic range ADC, are presented. No latch up events were detected up to an LET of 50.5 MeV.cm2/mg at 85 °C and 125 °C. No latch up events detected up to an LET of 60.4 MeV.cm2/mg at 85 °C.\",\"PeriodicalId\":135325,\"journal\":{\"name\":\"2016 IEEE Radiation Effects Data Workshop (REDW)\",\"volume\":\"99 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE Radiation Effects Data Workshop (REDW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NSREC.2016.7891737\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE Radiation Effects Data Workshop (REDW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NSREC.2016.7891737","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Single Event Effects Characterization of TI ADS1282-SP High Resolution ADC
The single event effects behavior of the ADS1282- SP, a high dynamic range ADC, are presented. No latch up events were detected up to an LET of 50.5 MeV.cm2/mg at 85 °C and 125 °C. No latch up events detected up to an LET of 60.4 MeV.cm2/mg at 85 °C.