J. Cruz-Colon, M. Hamlyn, V. Zhu, B. A. Dahl, T. Trinh, R. Baumann
{"title":"双数据速率(DDR)应用中TPS7H3301-SP线性稳压器的辐射评估","authors":"J. Cruz-Colon, M. Hamlyn, V. Zhu, B. A. Dahl, T. Trinh, R. Baumann","doi":"10.1109/NSREC.2016.7891727","DOIUrl":null,"url":null,"abstract":"Abstract- Single Events Effect (SEE) and Total Ionizing Dose (TID) results for a new Double Data Rate (DDR) linear voltage regulator are summarized, demonstrating robust SEE performance up to LETeff=65.1 MeV-cm2/mg and TID up to 100k Rads(Si).","PeriodicalId":135325,"journal":{"name":"2016 IEEE Radiation Effects Data Workshop (REDW)","volume":"200 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Radiation Evaluation of the TPS7H3301-SP Linear Regulator for Double Data Rate (DDR) Applications\",\"authors\":\"J. Cruz-Colon, M. Hamlyn, V. Zhu, B. A. Dahl, T. Trinh, R. Baumann\",\"doi\":\"10.1109/NSREC.2016.7891727\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Abstract- Single Events Effect (SEE) and Total Ionizing Dose (TID) results for a new Double Data Rate (DDR) linear voltage regulator are summarized, demonstrating robust SEE performance up to LETeff=65.1 MeV-cm2/mg and TID up to 100k Rads(Si).\",\"PeriodicalId\":135325,\"journal\":{\"name\":\"2016 IEEE Radiation Effects Data Workshop (REDW)\",\"volume\":\"200 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE Radiation Effects Data Workshop (REDW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NSREC.2016.7891727\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE Radiation Effects Data Workshop (REDW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NSREC.2016.7891727","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Radiation Evaluation of the TPS7H3301-SP Linear Regulator for Double Data Rate (DDR) Applications
Abstract- Single Events Effect (SEE) and Total Ionizing Dose (TID) results for a new Double Data Rate (DDR) linear voltage regulator are summarized, demonstrating robust SEE performance up to LETeff=65.1 MeV-cm2/mg and TID up to 100k Rads(Si).