单一事件颠覆人物塑造Xilinx UltraScale™的评价软错误缓解(SEM IP)工具

2016 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 1900-01-01 DOI:10.1109/NSREC.2016.7891745

P. Maillard, M. Hart, Jeff Barton, Paula Chang, Michael Welter, Robert Le, R. Ismail, Eric Crabill

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引用次数: 5

摘要

本文研究了Xilinx UltraScale Soft Error Mitigation (SEM IP)软件工具在64MeV质子源照射下的单事件扰动响应。然后将SEM SEU结果与LANSCE和Crocker收集的Xilinx 20nm Kintex系列的加速颗粒测试结果进行比较，以评估其检测&准确收集SEU。此外，还表征了赛灵思20nm堆叠间置硅(SSI)技术的SEU响应。给出了SEU和MBU的结果。

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Single-Event Upsets Characterization & Evaluation of Xilinx UltraScale™ Soft Error Mitigation (SEM IP) Tool

This paper examines the single-event upset response of the Xilinx UltraScale Soft Error Mitigation (SEM IP) software tool irradiated with a 64MeV proton source. The SEM SEU results are then compared to accelerated particle testing results for the Xilinx 20nm Kintex family, collected at LANSCE and Crocker, to evaluate its capability to detect & collect SEU accurately. Furthermore, Xilinx 20nm stacked silicon on interposer (SSI) technology SEU response is characterized. SEU and MBU results are presented.

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来源期刊

2016 IEEE Radiation Effects Data Workshop (REDW)

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