Single Event Effects Testing of the Hardened Texas Instruments MSP430FR5739 Microcontroller on with Embedded Ferroelectric Memory

Abstract

MSP430FR55739 tests at the Lawrence Berkeley National Laboratory (LBNL) Cyclotron used the Milli-Beam apparatus to restrict exposure to specific blocks. Instruction lockstep techniques were employed to synchronize test unit outputs with an unexposed device. In this paper, we present cross-sections for the device and functional blocks.