硬化德州仪器MSP430FR5739微控制器在嵌入式铁电存储器上的单事件效应测试

2016 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 1900-01-01 DOI:10.1109/NSREC.2016.7891740

James Aarestad, Paul Eaton, Will Burke, D. Alexander, J. Salzman

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引用次数: 0

摘要

MSP430FR55739测试在劳伦斯伯克利国家实验室(LBNL)回旋加速器使用毫米束装置来限制特定块的暴露。采用指令同步技术将测试单元输出与未暴露的设备同步。在本文中，我们给出了设备和功能块的横截面。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Single Event Effects Testing of the Hardened Texas Instruments MSP430FR5739 Microcontroller on with Embedded Ferroelectric Memory

MSP430FR55739 tests at the Lawrence Berkeley National Laboratory (LBNL) Cyclotron used the Milli-Beam apparatus to restrict exposure to specific blocks. Instruction lockstep techniques were employed to synchronize test unit outputs with an unexposed device. In this paper, we present cross-sections for the device and functional blocks.

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2016 IEEE Radiation Effects Data Workshop (REDW)

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