抗辐射母线开关系列的SEL和TID测试结果

2016 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 1900-01-01 DOI:10.1109/NSREC.2016.7891735

M. Von Thun, Scott A Sapp, D. Walz, Rex Anderson, T. Farris

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引用次数: 0

摘要

介绍了Cobham抗辐射母线开关系列产品的SEL和TID测试结果。该器件对有效LET ≤具有SEL免疫;100 MeV·cm2/mg, TID合格300krad(Si)。

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SEL and TID Test Results on a Radiation Hardened Bus Switch Family

The SEL and TID test results are presented for the Cobham radiation hardened bus switch family of products. The device is SEL immune to an effective LET ≤ 100 MeV·cm2/mg and TID qualified to 300krad(Si).

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来源期刊

2016 IEEE Radiation Effects Data Workshop (REDW)

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