Single-Event Upsets Characterization & Evaluation of Xilinx UltraScale™ Soft Error Mitigation (SEM IP) Tool

Abstract

This paper examines the single-event upset response of the Xilinx UltraScale Soft Error Mitigation (SEM IP) software tool irradiated with a 64MeV proton source. The SEM SEU results are then compared to accelerated particle testing results for the Xilinx 20nm Kintex family, collected at LANSCE and Crocker, to evaluate its capability to detect & collect SEU accurately. Furthermore, Xilinx 20nm stacked silicon on interposer (SSI) technology SEU response is characterized. SEU and MBU results are presented.