Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques最新文献_第2页

Development of a Kinetic Model of the Growth of Boroaluminized Diffusion Layers by Finding the Activation Energy from a Given Experimental Dependence

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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2025-03-17 DOI: 10.1134/S1027451024702124

U. L. Mishigdorzhiyn, B. E. Markhadayev, A. P. Semenov, N. S. Ulakhanov, A. S. Milonov, K. A. Demin

{"title":"Development of a Kinetic Model of the Growth of Boroaluminized Diffusion Layers by Finding the Activation Energy from a Given Experimental Dependence","authors":"U. L. Mishigdorzhiyn, B. E. Markhadayev, A. P. Semenov, N. S. Ulakhanov, A. S. Milonov, K. A. Demin","doi":"10.1134/S1027451024702124","DOIUrl":"10.1134/S1027451024702124","url":null,"abstract":"The thermal-chemical treatment of metals, such as boriding and boroaluminizing, significantly improve the performance properties of machine parts and tools by forming protective diffusion layers on the surface of products. The thickness of the resulting layers is one of the determining factors affecting the properties. To control layer growth, it is important to know the kinetic parameters that govern it during high-temperature holding. The problem of determining the activation energy of boron is considered in order to identify the growth kinetics and predict the thickness of the boroaluminized layer on steel 45. On the basis of experimental data, a model for calculating the activation energy and thickness of a diffusion layer, which characterize the kinetics of the boroaluminizing of the diffusion layer, is proposed. The activation energy of the formation of a boroaluminized layer in pastes on the surface of steel 45 is calculated according to the parabolic dependence of layer growth as a function of temperature and time.","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"18 1 supplement","pages":"S239 - S244"},"PeriodicalIF":0.5,"publicationDate":"2025-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143638100","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

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Absorption and Scattering of Neutrons during Sub-Barrier Reflection from a Surface

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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2025-03-17 DOI: 10.1134/S1027451024702264

Yu. V. Nikitenko

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Effect of Low-Dose Irradiation and Subsequent Isochronous Annealing on the Current-Voltage Characteristics of Silicon Carbide-Based Surface-Barrier Diodes

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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2025-03-17 DOI: 10.1134/S1027451024702239

A. M. Strel’chuk, V. V. Kozlovski, G. A. Oganesyan

{"title":"Effect of Low-Dose Irradiation and Subsequent Isochronous Annealing on the Current-Voltage Characteristics of Silicon Carbide-Based Surface-Barrier Diodes","authors":"A. M. Strel’chuk, V. V. Kozlovski, G. A. Oganesyan","doi":"10.1134/S1027451024702239","DOIUrl":"10.1134/S1027451024702239","url":null,"abstract":"A study was conducted on the effect of low-dose (~1016 cm–2) irradiation with electrons with an energy of 0.9 MeV and subsequent isochronous annealing at temperatures up to 550°C on the current-voltage characteristics of commercial rectifier diodes based on 4H-SiC with a doping level of (3–7) × 1015 cm–3. The previously established effect of increasing series resistance Rs of diodes under irradiation, the numerical value of the threshold dose of irradiation, and the effect of the spread of the value of Rs of identical diodes at the same dose of radiation have been confirmed. For the first time, isochronous annealing (without passing current during annealing) was performed at temperatures up to 550°C, significantly exceeding the maximum operating temperatures of the diodes. It has been shown that starting from temperatures ≥200°C the annealing of defects is observed, which is expressed in a decrease in the value of Rs at room temperature down to pre-irradiation values. Annealing also leads to a decrease in the reverse breakdown current.","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"18 1 supplement","pages":"S321 - S327"},"PeriodicalIF":0.5,"publicationDate":"2025-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143638233","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Stand for Certification of X-ray Optical Elements and Systems for Synchrotron Applications

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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2025-03-17 DOI: 10.1134/S1027451024701842

D. G. Reunov, A. D. Akhsakhalyan, E. I. Glushkov, I. G. Zabrodin, I. V. Malyshev, M. S. Mikhailenko, E. V. Petrakov, A. K. Chernyshev, N. I. Chkhalo

{"title":"Stand for Certification of X-ray Optical Elements and Systems for Synchrotron Applications","authors":"D. G. Reunov, A. D. Akhsakhalyan, E. I. Glushkov, I. G. Zabrodin, I. V. Malyshev, M. S. Mikhailenko, E. V. Petrakov, A. K. Chernyshev, N. I. Chkhalo","doi":"10.1134/S1027451024701842","DOIUrl":"10.1134/S1027451024701842","url":null,"abstract":"The article describes an X-ray optical certification setup based on a microfocus X-ray tube, a Kirkpatrick-Baez (KB) collimating system, and a Gpixel2020BSI matrix semiconductor detector. To minimize X-ray beam scattering and intensity loss due to absorption in air, vacuum-tight tubes with compton windows are installed between the microfocus X-ray tube and the KB system, and between the KB system and the detector. Pumping is performed by an oil-free fore-vacuum pump. The setup that has been developed allows for studying the X-ray optical scheme of two-mirror monochromators to determine the deformation of the beam wave front at their outputs, and to calibrate the movement of high-precision mechanical tables. The setup also allows for studying the focusing properties of the Kirkpatrick-Baez system, itself, namely, measuring the size of the focus spot and calibrating the piezo-drives of the mirrors. As a result of adjusting the collimating system, we obtained a converging beam, but this did not prevent us from measuring the wave front broadening upon reflection from the substrates for a two-mirror monochromator. Two substrates made of single-crystal silicon Si(100) were studied. It was shown that upon reflection from the substrate after chemical-mechanical polishing (CMP) only, the reflected beam, due to mirror shape errors, broadened by 18 μm, while after chemical-mechanical polishing and correction of local shape errors using an ion beam, the broadening was reduced to 11 μm, which corresponds to an angular error of the mirror at a level of 3 μrad. This is 7 times less than the angular divergence of the beam at the output of the collimating system, due to the size of the radiation source.","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"18 1 supplement","pages":"S38 - S44"},"PeriodicalIF":0.5,"publicationDate":"2025-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143638426","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Testing of X-ray Optics for Synchrotron Studies using a Laboratory Microfocus X-ray Source

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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2025-03-17 DOI: 10.1134/S1027451024701829

A. A. Barannikov, D. A. Zverev, I. I. Lyatun, I. B. Panormov, K. V. Rudenko, A. A. Snigirev

{"title":"Testing of X-ray Optics for Synchrotron Studies using a Laboratory Microfocus X-ray Source","authors":"A. A. Barannikov, D. A. Zverev, I. I. Lyatun, I. B. Panormov, K. V. Rudenko, A. A. Snigirev","doi":"10.1134/S1027451024701829","DOIUrl":"10.1134/S1027451024701829","url":null,"abstract":"This paper considers techniques for testing X-ray optics in laboratory conditions before its direct use at synchrotron radiation sources. The example of the ‘SynchrotronLike’ complex demonstrates the capabilities of modern laboratory X-ray optical equipment for studying the optical and functional properties of refractive X-ray lenses, transfocators, and diamond monochromators. Moreover, the paper describes ways of realizing synchrotron coherent experimental techniques such as microradian X-ray diffraction and X-ray reflecto-interferometry in laboratory conditions. Applying the high-brightness Excillum MetalJet microfocus X-ray tube with a liquid anode enables experiments with several optical transformations and provides higher spatial coherence of the radiation compared to classical laboratory sources. The high coherence of the radiation allows for observing interference on thin films and test X-ray interferometers. The presented results demonstrate the capabilities of modern laboratory X-ray optical equipment in solving problems that do not require high temporal and energy resolution. It significantly saves resources spent on research based on synchrotron radiation sources when a lot of measurements and tests for optimization of X-ray optics fabrication technology are required.","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"18 1 supplement","pages":"S24 - S33"},"PeriodicalIF":0.5,"publicationDate":"2025-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143638529","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

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Features of Magnetron Deposition by Sputtering Boron Target in Reactive Gases Medium

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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2025-03-17 DOI: 10.1134/S1027451024701908

G. Yu. Yushkov, V. D. Gridilev, A. G. Nikolaev

引用次数: 0

EBSD Characterization and Mechanical Properties of Boroaluminized Diffusion Layers on Surface of L6 Steel after Pulsed Electron Beam Processing 脉冲电子束处理后 L6 钢表面硼铝化扩散层的 EBSD 表征和力学性能

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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2025-03-17 DOI: 10.1134/S1027451024701994

N. S. Ulakhanov, U. L. Mishigdorzhiyn, M. S. Vorobyov, A. P. Semenov, K. A. Demin, P. V. Moskvin, A. G. Tikhonov, A. E. Balanovskiy

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Thermal Modes of Synthesis in Mechanoactivated Powder Mixture Ti + Al

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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2025-03-17 DOI: 10.1134/S1027451024701982

A. V. Sobachkin, V. Yu. Filimonov, M. V. Loginova, A. A. Sitnikov, V. I. Yakovlev, A. Z. Negodyaev, A. Yu. Myasnikov, A. A. Roznyj

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Study of the Surface Morphology and Inclusions of Heavy Metals in Basal-Faceted Sapphire Ribbons Using In-Line X-Ray Phase-Contrast Imaging

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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2025-03-17 DOI: 10.1134/S1027451024701817

T. S. Argunova, V. G. Kohn, J.-H. Lim, V. M. Krymov, A. V. Ankudinov

{"title":"Study of the Surface Morphology and Inclusions of Heavy Metals in Basal-Faceted Sapphire Ribbons Using In-Line X-Ray Phase-Contrast Imaging","authors":"T. S. Argunova, V. G. Kohn, J.-H. Lim, V. M. Krymov, A. V. Ankudinov","doi":"10.1134/S1027451024701817","DOIUrl":"10.1134/S1027451024701817","url":null,"abstract":"This study presents the results of research concerning microsteps on the surface and the inclusions of heavy metals in the volume of sapphire ribbons grown using Stepanov’s method. Basal-faceted sapphire ribbons exhibit a low density of steps, which are caused by small changes in the orientation of the growth surface or the thickness of the ribbon. Phase contrast imaging using synchrotron radiation is employed to study the defects. It is shown for the first time that the height of a step of 1 µm can be determined directly from the image. An analytical solution for the intensity distribution of the step in the case of fully coherent X-ray radiation is obtained. When the phase shift is small, there is a direct proportionality between contrast and step height, and the inverse problem is easily solved. The height obtained using the phase-contrast-imaging method is confirmed by measurements using atomic force microscopy. To analyze microinclusions, a computer simulation program is used, which allows for assessment of their sizes. We find that the experimental contrast matches the theoretical calculations only if the calculated intensity profile is convolved with a Gaussian function. The full width at half maximum of the Gaussian is independently obtained from preliminary measurements.","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"18 1 supplement","pages":"S16 - S23"},"PeriodicalIF":0.5,"publicationDate":"2025-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143638542","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Microstructure and Properties of Protective Ion-Plasma Coating on UFG Ti Alloy

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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2025-03-17 DOI: 10.1134/S1027451024701969

Ya. N. Savina, S. V. Ovchinnikov, R. R. Valiev, K. S. Selivanov

{"title":"Microstructure and Properties of Protective Ion-Plasma Coating on UFG Ti Alloy","authors":"Ya. N. Savina, S. V. Ovchinnikov, R. R. Valiev, K. S. Selivanov","doi":"10.1134/S1027451024701969","DOIUrl":"10.1134/S1027451024701969","url":null,"abstract":"The paper presents results of comprehensive studies on a fine structure of TiVN ion-plasma protective coating deposited on a Ti–6Al–4V substrate with an ultrafine-grained (UFG) structure. This coating considerably improves the performance properties of critical products operating under high loads in aggressive environments. In the article special attention is paid to features of formation of coating layers and their phase composition with account of effect caused the substrate ultrafine-grained structure. It is established that TiVN functional coating has a layered structure with thin layers of dark and light colors, which can be formed at different ratios of Ti and V concentrations due to planetary rotation of substrates. The structure of a TiVN functional layer is columnar and has an average diameter of about 17 nm. Based on microdiffraction patterns of a TiVN layer, it is found that the reflexes correspond to an fcc structure, which does not have a dominant textural component of growth. This might be conditioned by high level of ion activation of growth and multicomponent nature of the coating being terms for creation and retention of high density of defects. This fine structure of ion-plasma coating on a substrate with UFG structure provides the achievement of high adhesion and erosion resistance.","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"18 1 supplement","pages":"S127 - S135"},"PeriodicalIF":0.5,"publicationDate":"2025-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143638544","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0