Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques最新文献_第2页

Testing of X-ray Optics for Synchrotron Studies using a Laboratory Microfocus X-ray Source 使用实验室微聚焦x射线源进行同步加速器研究的x射线光学测试

IF 0.5

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2025-03-17 DOI: 10.1134/S1027451024701829

A. A. Barannikov, D. A. Zverev, I. I. Lyatun, I. B. Panormov, K. V. Rudenko, A. A. Snigirev

{"title":"Testing of X-ray Optics for Synchrotron Studies using a Laboratory Microfocus X-ray Source","authors":"A. A. Barannikov, D. A. Zverev, I. I. Lyatun, I. B. Panormov, K. V. Rudenko, A. A. Snigirev","doi":"10.1134/S1027451024701829","DOIUrl":"10.1134/S1027451024701829","url":null,"abstract":"This paper considers techniques for testing X-ray optics in laboratory conditions before its direct use at synchrotron radiation sources. The example of the ‘SynchrotronLike’ complex demonstrates the capabilities of modern laboratory X-ray optical equipment for studying the optical and functional properties of refractive X-ray lenses, transfocators, and diamond monochromators. Moreover, the paper describes ways of realizing synchrotron coherent experimental techniques such as microradian X-ray diffraction and X-ray reflecto-interferometry in laboratory conditions. Applying the high-brightness Excillum MetalJet microfocus X-ray tube with a liquid anode enables experiments with several optical transformations and provides higher spatial coherence of the radiation compared to classical laboratory sources. The high coherence of the radiation allows for observing interference on thin films and test X-ray interferometers. The presented results demonstrate the capabilities of modern laboratory X-ray optical equipment in solving problems that do not require high temporal and energy resolution. It significantly saves resources spent on research based on synchrotron radiation sources when a lot of measurements and tests for optimization of X-ray optics fabrication technology are required.","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"18 1 supplement","pages":"S24 - S33"},"PeriodicalIF":0.5,"publicationDate":"2025-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143638529","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Features of Magnetron Deposition by Sputtering Boron Target in Reactive Gases Medium 反应气体介质中溅射硼靶磁控管沉积的特点

IF 0.5

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2025-03-17 DOI: 10.1134/S1027451024701908

G. Yu. Yushkov, V. D. Gridilev, A. G. Nikolaev

引用次数: 0

Development of a Kinetic Model of the Growth of Boroaluminized Diffusion Layers by Finding the Activation Energy from a Given Experimental Dependence 从给定的实验依赖中求活化能建立硼铝化扩散层生长的动力学模型

IF 0.5

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2025-03-17 DOI: 10.1134/S1027451024702124

U. L. Mishigdorzhiyn, B. E. Markhadayev, A. P. Semenov, N. S. Ulakhanov, A. S. Milonov, K. A. Demin

{"title":"Development of a Kinetic Model of the Growth of Boroaluminized Diffusion Layers by Finding the Activation Energy from a Given Experimental Dependence","authors":"U. L. Mishigdorzhiyn, B. E. Markhadayev, A. P. Semenov, N. S. Ulakhanov, A. S. Milonov, K. A. Demin","doi":"10.1134/S1027451024702124","DOIUrl":"10.1134/S1027451024702124","url":null,"abstract":"The thermal-chemical treatment of metals, such as boriding and boroaluminizing, significantly improve the performance properties of machine parts and tools by forming protective diffusion layers on the surface of products. The thickness of the resulting layers is one of the determining factors affecting the properties. To control layer growth, it is important to know the kinetic parameters that govern it during high-temperature holding. The problem of determining the activation energy of boron is considered in order to identify the growth kinetics and predict the thickness of the boroaluminized layer on steel 45. On the basis of experimental data, a model for calculating the activation energy and thickness of a diffusion layer, which characterize the kinetics of the boroaluminizing of the diffusion layer, is proposed. The activation energy of the formation of a boroaluminized layer in pastes on the surface of steel 45 is calculated according to the parabolic dependence of layer growth as a function of temperature and time.","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"18 1 supplement","pages":"S239 - S244"},"PeriodicalIF":0.5,"publicationDate":"2025-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143638100","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Absorption and Scattering of Neutrons during Sub-Barrier Reflection from a Surface 表面亚势垒反射过程中中子的吸收和散射

IF 0.5

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2025-03-17 DOI: 10.1134/S1027451024702264

Yu. V. Nikitenko

引用次数: 0

Effect of Low-Dose Irradiation and Subsequent Isochronous Annealing on the Current-Voltage Characteristics of Silicon Carbide-Based Surface-Barrier Diodes 低剂量辐照及后续等时退火对碳化硅基表面势垒二极管电流-电压特性的影响

IF 0.5

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2025-03-17 DOI: 10.1134/S1027451024702239

A. M. Strel’chuk, V. V. Kozlovski, G. A. Oganesyan

{"title":"Effect of Low-Dose Irradiation and Subsequent Isochronous Annealing on the Current-Voltage Characteristics of Silicon Carbide-Based Surface-Barrier Diodes","authors":"A. M. Strel’chuk, V. V. Kozlovski, G. A. Oganesyan","doi":"10.1134/S1027451024702239","DOIUrl":"10.1134/S1027451024702239","url":null,"abstract":"A study was conducted on the effect of low-dose (~1016 cm–2) irradiation with electrons with an energy of 0.9 MeV and subsequent isochronous annealing at temperatures up to 550°C on the current-voltage characteristics of commercial rectifier diodes based on 4H-SiC with a doping level of (3–7) × 1015 cm–3. The previously established effect of increasing series resistance Rs of diodes under irradiation, the numerical value of the threshold dose of irradiation, and the effect of the spread of the value of Rs of identical diodes at the same dose of radiation have been confirmed. For the first time, isochronous annealing (without passing current during annealing) was performed at temperatures up to 550°C, significantly exceeding the maximum operating temperatures of the diodes. It has been shown that starting from temperatures ≥200°C the annealing of defects is observed, which is expressed in a decrease in the value of Rs at room temperature down to pre-irradiation values. Annealing also leads to a decrease in the reverse breakdown current.","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"18 1 supplement","pages":"S321 - S327"},"PeriodicalIF":0.5,"publicationDate":"2025-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143638233","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Stand for Certification of X-ray Optical Elements and Systems for Synchrotron Applications 用于同步加速器应用的x射线光学元件和系统的认证

IF 0.5

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2025-03-17 DOI: 10.1134/S1027451024701842

D. G. Reunov, A. D. Akhsakhalyan, E. I. Glushkov, I. G. Zabrodin, I. V. Malyshev, M. S. Mikhailenko, E. V. Petrakov, A. K. Chernyshev, N. I. Chkhalo

{"title":"Stand for Certification of X-ray Optical Elements and Systems for Synchrotron Applications","authors":"D. G. Reunov, A. D. Akhsakhalyan, E. I. Glushkov, I. G. Zabrodin, I. V. Malyshev, M. S. Mikhailenko, E. V. Petrakov, A. K. Chernyshev, N. I. Chkhalo","doi":"10.1134/S1027451024701842","DOIUrl":"10.1134/S1027451024701842","url":null,"abstract":"The article describes an X-ray optical certification setup based on a microfocus X-ray tube, a Kirkpatrick-Baez (KB) collimating system, and a Gpixel2020BSI matrix semiconductor detector. To minimize X-ray beam scattering and intensity loss due to absorption in air, vacuum-tight tubes with compton windows are installed between the microfocus X-ray tube and the KB system, and between the KB system and the detector. Pumping is performed by an oil-free fore-vacuum pump. The setup that has been developed allows for studying the X-ray optical scheme of two-mirror monochromators to determine the deformation of the beam wave front at their outputs, and to calibrate the movement of high-precision mechanical tables. The setup also allows for studying the focusing properties of the Kirkpatrick-Baez system, itself, namely, measuring the size of the focus spot and calibrating the piezo-drives of the mirrors. As a result of adjusting the collimating system, we obtained a converging beam, but this did not prevent us from measuring the wave front broadening upon reflection from the substrates for a two-mirror monochromator. Two substrates made of single-crystal silicon Si(100) were studied. It was shown that upon reflection from the substrate after chemical-mechanical polishing (CMP) only, the reflected beam, due to mirror shape errors, broadened by 18 μm, while after chemical-mechanical polishing and correction of local shape errors using an ion beam, the broadening was reduced to 11 μm, which corresponds to an angular error of the mirror at a level of 3 μrad. This is 7 times less than the angular divergence of the beam at the output of the collimating system, due to the size of the radiation source.","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"18 1 supplement","pages":"S38 - S44"},"PeriodicalIF":0.5,"publicationDate":"2025-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143638426","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Thermal Modes of Synthesis in Mechanoactivated Powder Mixture Ti + Al 机械活化粉末Ti + Al混合物合成的热模式

IF 0.5

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2025-03-17 DOI: 10.1134/S1027451024701982

A. V. Sobachkin, V. Yu. Filimonov, M. V. Loginova, A. A. Sitnikov, V. I. Yakovlev, A. Z. Negodyaev, A. Yu. Myasnikov, A. A. Roznyj

引用次数: 0

Study of the Surface Morphology and Inclusions of Heavy Metals in Basal-Faceted Sapphire Ribbons Using In-Line X-Ray Phase-Contrast Imaging 用直线x射线相衬成像技术研究基底面蓝宝石带中重金属的表面形貌和内含物

IF 0.5

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2025-03-17 DOI: 10.1134/S1027451024701817

T. S. Argunova, V. G. Kohn, J.-H. Lim, V. M. Krymov, A. V. Ankudinov

{"title":"Study of the Surface Morphology and Inclusions of Heavy Metals in Basal-Faceted Sapphire Ribbons Using In-Line X-Ray Phase-Contrast Imaging","authors":"T. S. Argunova, V. G. Kohn, J.-H. Lim, V. M. Krymov, A. V. Ankudinov","doi":"10.1134/S1027451024701817","DOIUrl":"10.1134/S1027451024701817","url":null,"abstract":"This study presents the results of research concerning microsteps on the surface and the inclusions of heavy metals in the volume of sapphire ribbons grown using Stepanov’s method. Basal-faceted sapphire ribbons exhibit a low density of steps, which are caused by small changes in the orientation of the growth surface or the thickness of the ribbon. Phase contrast imaging using synchrotron radiation is employed to study the defects. It is shown for the first time that the height of a step of 1 µm can be determined directly from the image. An analytical solution for the intensity distribution of the step in the case of fully coherent X-ray radiation is obtained. When the phase shift is small, there is a direct proportionality between contrast and step height, and the inverse problem is easily solved. The height obtained using the phase-contrast-imaging method is confirmed by measurements using atomic force microscopy. To analyze microinclusions, a computer simulation program is used, which allows for assessment of their sizes. We find that the experimental contrast matches the theoretical calculations only if the calculated intensity profile is convolved with a Gaussian function. The full width at half maximum of the Gaussian is independently obtained from preliminary measurements.","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"18 1 supplement","pages":"S16 - S23"},"PeriodicalIF":0.5,"publicationDate":"2025-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143638542","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Study of Zinc Implanted Crystalline Quartz 锌注入结晶石英的研究

IF 0.5

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2025-03-17 DOI: 10.1134/S1027451024702045

V. V. Privezentsev, A. A. Firsov, V. S. Kulikauskas, M. I. Voronova, D. A. Kiselev, B. R. Senatulin

{"title":"Study of Zinc Implanted Crystalline Quartz","authors":"V. V. Privezentsev, A. A. Firsov, V. S. Kulikauskas, M. I. Voronova, D. A. Kiselev, B. R. Senatulin","doi":"10.1134/S1027451024702045","DOIUrl":"10.1134/S1027451024702045","url":null,"abstract":"The results of a study of crystalline quartz implanted by 64Zn+ ions with a dose of 5 × 1016/cm2 and an energy of 40 keV are presented. The samples were annealed in air in steps of 100°C for 1 h at each step in the temperature range of 400−700°C. The methods used for the study were atomic force microscopy, X-ray diffraction phase analysis, X-ray photoelectron spectroscopy, and Auger electron spectroscopy. It was found that after implantation, the phases of metallic zinc Zn and carbon C were fixed in the near-surface layer. After annealing at 700°C, the zinc oxide phase ZnO appears, and after annealing above 700°C, the zinc silicide phase Zn2SiO4 appears. It was found that after annealing at 400°C the roughness increases by 2 orders of magnitude compared to the state after implantation, and after annealing at 700°C, the roughness of the quartz surface decreases by an order of magnitude compared to annealing at 400°C. After annealing at 700°C, numerous Zn-containing nanoparticles and craters are fixed on the surface and a zinc silicide phase is formed.","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"18 1 supplement","pages":"S186 - S192"},"PeriodicalIF":0.5,"publicationDate":"2025-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143638546","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

EBSD Characterization and Mechanical Properties of Boroaluminized Diffusion Layers on Surface of L6 Steel after Pulsed Electron Beam Processing 脉冲电子束处理后 L6 钢表面硼铝化扩散层的 EBSD 表征和力学性能

IF 0.5

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2025-03-17 DOI: 10.1134/S1027451024701994

N. S. Ulakhanov, U. L. Mishigdorzhiyn, M. S. Vorobyov, A. P. Semenov, K. A. Demin, P. V. Moskvin, A. G. Tikhonov, A. E. Balanovskiy

引用次数: 0