Stand for Certification of X-ray Optical Elements and Systems for Synchrotron Applications

IF 0.5 Q4 PHYSICS, CONDENSED MATTER
D. G. Reunov, A. D. Akhsakhalyan, E. I. Glushkov, I. G. Zabrodin, I. V. Malyshev, M. S. Mikhailenko, E. V. Petrakov, A. K. Chernyshev, N. I. Chkhalo
{"title":"Stand for Certification of X-ray Optical Elements and Systems for Synchrotron Applications","authors":"D. G. Reunov,&nbsp;A. D. Akhsakhalyan,&nbsp;E. I. Glushkov,&nbsp;I. G. Zabrodin,&nbsp;I. V. Malyshev,&nbsp;M. S. Mikhailenko,&nbsp;E. V. Petrakov,&nbsp;A. K. Chernyshev,&nbsp;N. I. Chkhalo","doi":"10.1134/S1027451024701842","DOIUrl":null,"url":null,"abstract":"<p>The article describes an X-ray optical certification setup based on a microfocus X-ray tube, a Kirkpatrick-Baez (KB) collimating system, and a Gpixel2020BSI matrix semiconductor detector. To minimize X-ray beam scattering and intensity loss due to absorption in air, vacuum-tight tubes with compton windows are installed between the microfocus X-ray tube and the KB system, and between the KB system and the detector. Pumping is performed by an oil-free fore-vacuum pump. The setup that has been developed allows for studying the X-ray optical scheme of two-mirror monochromators to determine the deformation of the beam wave front at their outputs, and to calibrate the movement of high-precision mechanical tables. The setup also allows for studying the focusing properties of the Kirkpatrick-Baez system, itself, namely, measuring the size of the focus spot and calibrating the piezo-drives of the mirrors. As a result of adjusting the collimating system, we obtained a converging beam, but this did not prevent us from measuring the wave front broadening upon reflection from the substrates for a two-mirror monochromator. Two substrates made of single-crystal silicon Si(100) were studied. It was shown that upon reflection from the substrate after chemical-mechanical polishing (CMP) only, the reflected beam, due to mirror shape errors, broadened by 18 μm, while after chemical-mechanical polishing and correction of local shape errors using an ion beam, the broadening was reduced to 11 μm, which corresponds to an angular error of the mirror at a level of 3 μrad. This is 7 times less than the angular divergence of the beam at the output of the collimating system, due to the size of the radiation source.</p>","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"18 1 supplement","pages":"S38 - S44"},"PeriodicalIF":0.5000,"publicationDate":"2025-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1134/S1027451024701842","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
引用次数: 0

Abstract

The article describes an X-ray optical certification setup based on a microfocus X-ray tube, a Kirkpatrick-Baez (KB) collimating system, and a Gpixel2020BSI matrix semiconductor detector. To minimize X-ray beam scattering and intensity loss due to absorption in air, vacuum-tight tubes with compton windows are installed between the microfocus X-ray tube and the KB system, and between the KB system and the detector. Pumping is performed by an oil-free fore-vacuum pump. The setup that has been developed allows for studying the X-ray optical scheme of two-mirror monochromators to determine the deformation of the beam wave front at their outputs, and to calibrate the movement of high-precision mechanical tables. The setup also allows for studying the focusing properties of the Kirkpatrick-Baez system, itself, namely, measuring the size of the focus spot and calibrating the piezo-drives of the mirrors. As a result of adjusting the collimating system, we obtained a converging beam, but this did not prevent us from measuring the wave front broadening upon reflection from the substrates for a two-mirror monochromator. Two substrates made of single-crystal silicon Si(100) were studied. It was shown that upon reflection from the substrate after chemical-mechanical polishing (CMP) only, the reflected beam, due to mirror shape errors, broadened by 18 μm, while after chemical-mechanical polishing and correction of local shape errors using an ion beam, the broadening was reduced to 11 μm, which corresponds to an angular error of the mirror at a level of 3 μrad. This is 7 times less than the angular divergence of the beam at the output of the collimating system, due to the size of the radiation source.

Abstract Image

用于同步加速器应用的x射线光学元件和系统的认证
本文介绍了一种基于微聚焦x射线管、Kirkpatrick-Baez (KB)准直系统和Gpixel2020BSI矩阵半导体探测器的x射线光学认证装置。为了最大限度地减少x射线束的散射和由于空气吸收而造成的强度损失,在微聚焦x射线管和KB系统之间以及KB系统和探测器之间安装了带有康普顿窗口的真空密管。泵送由无油前真空泵执行。所开发的装置允许研究双镜单色仪的x射线光学方案,以确定其输出时光束波前的变形,并校准高精度机械表的运动。该装置还允许研究Kirkpatrick-Baez系统本身的聚焦特性,即测量焦点光斑的大小并校准反射镜的压电驱动。由于调整了准直系统,我们获得了会聚光束,但这并不妨碍我们测量双镜单色仪基片反射后的波前展宽。研究了两种由单晶硅Si(100)制成的衬底。结果表明,仅经过化学机械抛光(CMP)后,反射光束由于镜面形状误差而展宽了18 μm,而经过化学机械抛光和离子束修正局部形状误差后,反射光束的展宽减小到11 μm,相当于镜面的角误差在3 μrad水平。由于辐射源的大小,这比光束在准直系统输出处的角散度小7倍。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信