Development of a Kinetic Model of the Growth of Boroaluminized Diffusion Layers by Finding the Activation Energy from a Given Experimental Dependence

IF 0.5 Q4 PHYSICS, CONDENSED MATTER
U. L. Mishigdorzhiyn, B. E. Markhadayev, A. P. Semenov, N. S. Ulakhanov, A. S. Milonov, K. A. Demin
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引用次数: 0

Abstract

The thermal-chemical treatment of metals, such as boriding and boroaluminizing, significantly improve the performance properties of machine parts and tools by forming protective diffusion layers on the surface of products. The thickness of the resulting layers is one of the determining factors affecting the properties. To control layer growth, it is important to know the kinetic parameters that govern it during high-temperature holding. The problem of determining the activation energy of boron is considered in order to identify the growth kinetics and predict the thickness of the boroaluminized layer on steel 45. On the basis of experimental data, a model for calculating the activation energy and thickness of a diffusion layer, which characterize the kinetics of the boroaluminizing of the diffusion layer, is proposed. The activation energy of the formation of a boroaluminized layer in pastes on the surface of steel 45 is calculated according to the parabolic dependence of layer growth as a function of temperature and time.

Abstract Image

从给定的实验依赖中求活化能建立硼铝化扩散层生长的动力学模型
金属的热化学处理,如渗硼和渗硼,通过在产品表面形成保护扩散层,显著提高了机械零件和工具的性能。所得层的厚度是影响性能的决定性因素之一。为了控制层的生长,了解在高温保温过程中控制层生长的动力学参数是很重要的。为了确定45钢表面硼渗铝层的生长动力学和预测渗硼层的厚度,考虑了硼活化能的确定问题。在实验数据的基础上,提出了表征扩散层渗硼动力学的活化能和扩散层厚度的计算模型。根据层生长随温度和时间的抛物线关系,计算了45钢表面膏体中硼铝层的活化能。
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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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