Testing of X-ray Optics for Synchrotron Studies using a Laboratory Microfocus X-ray Source

IF 0.5 Q4 PHYSICS, CONDENSED MATTER
A. A. Barannikov, D. A. Zverev, I. I. Lyatun, I. B. Panormov, K. V. Rudenko, A. A. Snigirev
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Abstract

This paper considers techniques for testing X-ray optics in laboratory conditions before its direct use at synchrotron radiation sources. The example of the ‘SynchrotronLike’ complex demonstrates the capabilities of modern laboratory X-ray optical equipment for studying the optical and functional properties of refractive X-ray lenses, transfocators, and diamond monochromators. Moreover, the paper describes ways of realizing synchrotron coherent experimental techniques such as microradian X-ray diffraction and X-ray reflecto-interferometry in laboratory conditions. Applying the high-brightness Excillum MetalJet microfocus X-ray tube with a liquid anode enables experiments with several optical transformations and provides higher spatial coherence of the radiation compared to classical laboratory sources. The high coherence of the radiation allows for observing interference on thin films and test X-ray interferometers. The presented results demonstrate the capabilities of modern laboratory X-ray optical equipment in solving problems that do not require high temporal and energy resolution. It significantly saves resources spent on research based on synchrotron radiation sources when a lot of measurements and tests for optimization of X-ray optics fabrication technology are required.

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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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