IEEE Design & Test of Computers最新文献_第5页

The Embedded Object Concept: a Lego-like Approach to Making Embedded Systems 嵌入式对象概念:制作嵌入式系统的乐高式方法

IEEE Design & Test of Computers Pub Date : 2013-01-01 DOI: 10.1109/MDT.2009.103

Tero Vallius, J. Röning

引用次数: 0

VPOS: A Specific Operating System for the FPGA Verification of Microprocessor System-level Functions VPOS:用于FPGA验证微处理器系统级功能的特定操作系统

IEEE Design & Test of Computers Pub Date : 2013-01-01 DOI: 10.1109/MDT.2009.104

Lingkan Gong, Jin-Qin Lu

引用次数: 0

Modeling Low-K Dielectric Breakdown in the Presence of Multiple Feature Geometries and Die-to-Die Linewidth Variation 存在多种特征几何形状和模对模线宽变化的低k介电击穿建模

IEEE Design & Test of Computers Pub Date : 2013-01-01 DOI: 10.1109/MDT.2009.131

L. Milor

引用次数: 0

An Overview of Mixed-Signal Production Test from a Measurement Principle Perspective 从测量原理的角度概述混合信号产生测试

IEEE Design & Test of Computers Pub Date : 2013-01-01 DOI: 10.1109/MDT.2009.92

G. Roberts, S. Aouini

引用次数: 5

Balancing new reliability challenges and system performance at the architecture level 在架构级别平衡新的可靠性挑战和系统性能

IEEE Design & Test of Computers Pub Date : 2013-01-01 DOI: 10.1109/MDT.2009.129

P. Kudva, J. Rivers

引用次数: 3

Overcoming Early-Life Failure and Aging Challenges for Robust System Design 克服早期失效和老化的鲁棒系统设计挑战

IEEE Design & Test of Computers Pub Date : 2013-01-01 DOI: 10.1109/MDT.2009.132

Yanjing Li, S. Mitra, Donald S. Gardner, Young Moon Kim, E. Mintarno

引用次数: 9

Design of 3D DRAM and Its Application in 3D Integrated Multi-Core Computing Systems 三维DRAM的设计及其在三维集成多核计算系统中的应用

IEEE Design & Test of Computers Pub Date : 2013-01-01 DOI: 10.1109/MDT.2009.93

Hongbin Sun, Jibang Liu, Rakesh S. Anigundi, Nanning Zheng, James J.-Q. Lu, Rose Ken, Tong Zhang

引用次数: 16

A Novel Simulation Fault Injection using Electronic Systems Level Simulation Models 基于电子系统级仿真模型的新型仿真故障注入

IEEE Design & Test of Computers Pub Date : 2013-01-01 DOI: 10.1109/MDT.2009.128

Jongwhoa Na

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引用次数: 3

An interconnect strategy for a heterogeneous processor 异构处理器的互连策略

IEEE Design & Test of Computers Pub Date : 2013-01-01 DOI: 10.1109/MDT.2009.160

M. Kuehnle, A. Deledda

引用次数: 0

Reliability Implications of NBTI in Digital Integrated Circuits 数字集成电路中NBTI对可靠性的影响

IEEE Design & Test of Computers Pub Date : 2013-01-01 DOI: 10.1109/MDT.2009.133

S. P. Park, Kunhyuk Kang, K. Roy

引用次数: 3