{"title":"Message From the Steering Committee","authors":"P. Gulak, Rajesh K. Gupta, G. Setti, Y. Zorian","doi":"10.1109/MDT.2012.2184662","DOIUrl":"https://doi.org/10.1109/MDT.2012.2184662","url":null,"abstract":"","PeriodicalId":50392,"journal":{"name":"IEEE Design & Test of Computers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2020-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72575815","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Conference reports","authors":"Jorge A. Pérez","doi":"10.1145/3373394.3373397","DOIUrl":"https://doi.org/10.1145/3373394.3373397","url":null,"abstract":"In this installment of the conference report column, Alberto Lluch Lafuente reports on DisCoTec 2019, the 14th International Federated Conference on Distributed Computing Techniques, of which he was the general chair. This event took place in Kongens Lyngby, Denmark, in June 17--21, 2019.1","PeriodicalId":50392,"journal":{"name":"IEEE Design & Test of Computers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2019-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73965074","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Conference Reports","authors":"Michael Rovatsos","doi":"10.1145/3236644.3236648","DOIUrl":"https://doi.org/10.1145/3236644.3236648","url":null,"abstract":"1. 13th IEEE International On-Line Testing SymposiumDimitris Gizopoulos (University of Piraeus), TM Mak (Intel), Michael Nicolaidis (TIMA), and Antonis Paschalis (University of Athens)The 13th IEEE International On-Line Testing Symposium took place on 8-11 July 2007 in Crete, Greece. The IOLTS 07 technical program began with a TTTC Test Technology Educational Program (TTEP) full-day tutorial. There were also three excellent keynotes. The technical program included a regular track of 11 paper sessions (with 33 technical papers) and an interactive poster session, as well as three special sessions. 2. 4th IEEE International Workshop on Silicon Debug and Diagnosis Rob Aitken (ARM) and Bart Vermeulen (NXP Semiconductors) SDD 07 took place on 23-24 May in Freiburg, Germany, colocated with the 12th IEEE European Test Symposium (ETS). The workshop began with a keynote address by Rolf Kuehnis of Nokia, Finland, on the debugging needs of wireless applications. The body of the workshop comprised four sessions with full-length paper presentations. In addition, a panel of debugging experts explored and discussed the possibilities for fostering further collaboration between industry, tool vendors, and academia in silicon debugging and diagnosis.","PeriodicalId":50392,"journal":{"name":"IEEE Design & Test of Computers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1145/3236644.3236648","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45046733","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Conference Reports","authors":"Jorge A. Pérez","doi":"10.1145/3242953.3242966","DOIUrl":"https://doi.org/10.1145/3242953.3242966","url":null,"abstract":"In this installment of the conference report column, Claudio Antares Mezzina reports on the 13th International Federated Conference on Distributed Computing Techniques (DisCoTec 2018), which took place in Madrid (Spain) during June 18--21, 2018.1 This was the 13th edition of this event, which included three conferences (COORDINATION, DAIS, and FORTE) and one workshop (ICE). I am most grateful to Claudio for his detailed report.","PeriodicalId":50392,"journal":{"name":"IEEE Design & Test of Computers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1145/3242953.3242966","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48565338","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Editorial Calendar","authors":"Scott Wilson","doi":"10.1190/tle37100718.1","DOIUrl":"https://doi.org/10.1190/tle37100718.1","url":null,"abstract":"The Editorial Calendar details upcoming (approximately one year in advance) publication plans for The Leading Edge. This includes all special sections, guest editors, and information about submitting articles to TLE.","PeriodicalId":50392,"journal":{"name":"IEEE Design & Test of Computers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86997560","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"CEDA Currents","authors":"J. L. Ayala","doi":"10.1109/mdt.2011.29","DOIUrl":"https://doi.org/10.1109/mdt.2011.29","url":null,"abstract":"Provides several short items that may include news, reviews or technical notes that should be of interest to practitioners and researchers.","PeriodicalId":50392,"journal":{"name":"IEEE Design & Test of Computers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2017-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/mdt.2011.29","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42801008","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"CEDA Currents","authors":"J. L. Ayala","doi":"10.1109/MDAT.2017.2740899","DOIUrl":"https://doi.org/10.1109/MDAT.2017.2740899","url":null,"abstract":"At the end of 2017, Vijaykrishnan Nayaranan, Distinguished Professor of Computer Science and Engineering and Electrical Engineering at Pennsylvania State University, USA, completed his four-year service as the Editor-in-Chief (EIC) for the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ( TCAD ). Vijay has not only done an excellent job in keeping up the quality of TCAD and the traditional EDA topics, he has also developed emerging topics like embedded systems, software, and security at TCAD .","PeriodicalId":50392,"journal":{"name":"IEEE Design & Test of Computers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2017-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/MDAT.2017.2740899","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62453568","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Test Technology TC Newsletter","authors":"Theo Charides","doi":"10.1109/MDAT.2017.2730838","DOIUrl":"https://doi.org/10.1109/MDAT.2017.2730838","url":null,"abstract":"TTTC News The TTTC website always lists the latest features and information for its visitors! To find out more, please visit the website at http://www.ieee-tttc.org/ .","PeriodicalId":50392,"journal":{"name":"IEEE Design & Test of Computers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/MDAT.2017.2730838","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"44734068","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"May CEDA Currents","authors":"J. L. Ayala","doi":"10.1109/MDAT.2017.2710283","DOIUrl":"https://doi.org/10.1109/MDAT.2017.2710283","url":null,"abstract":"","PeriodicalId":50392,"journal":{"name":"IEEE Design & Test of Computers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2017-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/MDAT.2017.2710283","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42625740","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Recap of the 53rd Design Automation Conference (DAC)","authors":"Alpert Charles Jay","doi":"10.1109/MDAT.2016.2589222","DOIUrl":"https://doi.org/10.1109/MDAT.2016.2589222","url":null,"abstract":"","PeriodicalId":50392,"journal":{"name":"IEEE Design & Test of Computers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2016-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/MDAT.2016.2589222","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62453789","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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