会议报告

Michael Rovatsos
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引用次数: 0

摘要

1.第13届IEEE国际在线测试研讨会Dimitris Gizopoulos(比雷埃夫斯大学)、TM Mak(英特尔)、Michael Nicolaidis(TIMA)和Antonis Paschalis(雅典大学)第13届IEEEInternational在线测试研讨会于2007年7月8日至11日在希腊克里特岛举行。IOLTS 07技术课程以TTTC测试技术教育课程(TTEP)全天教程开始。还有三篇精彩的主题演讲。技术方案包括11次定期论文会议(33次技术论文)和一次互动海报会议,以及三次特别会议。2.第四届IEEE硅调试与诊断国际研讨会Rob Aitken(ARM)和Bart Vermeulen(NXP Semiconductors)SDD 07于5月23日至24日在德国弗赖堡举行,与第十二届IEEE欧洲测试研讨会(ETS)同期举行。研讨会开始时,芬兰诺基亚的Rolf Kuehnis就无线应用程序的调试需求发表了主题演讲。讲习班的主体部分包括四次会议,并作了长篇论文介绍。此外,一个调试专家小组探讨并讨论了促进工业界、工具供应商和学术界在硅调试和诊断方面进一步合作的可能性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Conference Reports
1. 13th IEEE International On-Line Testing SymposiumDimitris Gizopoulos (University of Piraeus), TM Mak (Intel), Michael Nicolaidis (TIMA), and Antonis Paschalis (University of Athens)The 13th IEEE International On-Line Testing Symposium took place on 8-11 July 2007 in Crete, Greece. The IOLTS 07 technical program began with a TTTC Test Technology Educational Program (TTEP) full-day tutorial. There were also three excellent keynotes. The technical program included a regular track of 11 paper sessions (with 33 technical papers) and an interactive poster session, as well as three special sessions. 2. 4th IEEE International Workshop on Silicon Debug and Diagnosis Rob Aitken (ARM) and Bart Vermeulen (NXP Semiconductors) SDD 07 took place on 23-24 May in Freiburg, Germany, colocated with the 12th IEEE European Test Symposium (ETS). The workshop began with a keynote address by Rolf Kuehnis of Nokia, Finland, on the debugging needs of wireless applications. The body of the workshop comprised four sessions with full-length paper presentations. In addition, a panel of debugging experts explored and discussed the possibilities for fostering further collaboration between industry, tool vendors, and academia in silicon debugging and diagnosis.
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来源期刊
IEEE Design & Test of Computers
IEEE Design & Test of Computers 工程技术-工程:电子与电气
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