Conference Reports

Abstract

1. 13th IEEE International On-Line Testing SymposiumDimitris Gizopoulos (University of Piraeus), TM Mak (Intel), Michael Nicolaidis (TIMA), and Antonis Paschalis (University of Athens)The 13th IEEE International On-Line Testing Symposium took place on 8-11 July 2007 in Crete, Greece. The IOLTS 07 technical program began with a TTTC Test Technology Educational Program (TTEP) full-day tutorial. There were also three excellent keynotes. The technical program included a regular track of 11 paper sessions (with 33 technical papers) and an interactive poster session, as well as three special sessions. 2. 4th IEEE International Workshop on Silicon Debug and Diagnosis Rob Aitken (ARM) and Bart Vermeulen (NXP Semiconductors) SDD 07 took place on 23-24 May in Freiburg, Germany, colocated with the 12th IEEE European Test Symposium (ETS). The workshop began with a keynote address by Rolf Kuehnis of Nokia, Finland, on the debugging needs of wireless applications. The body of the workshop comprised four sessions with full-length paper presentations. In addition, a panel of debugging experts explored and discussed the possibilities for fostering further collaboration between industry, tool vendors, and academia in silicon debugging and diagnosis.