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Dual-Control Self-Healing Architecture for High-Performance Radio SoCs 高性能无线电soc的双控制自愈架构
IEEE Design & Test of Computers Pub Date : 2012-12-01 DOI: 10.1109/MDT.2012.2213571
Charles Chien, A. Tang, F. Hsiao, M. Chang
{"title":"Dual-Control Self-Healing Architecture for High-Performance Radio SoCs","authors":"Charles Chien, A. Tang, F. Hsiao, M. Chang","doi":"10.1109/MDT.2012.2213571","DOIUrl":"https://doi.org/10.1109/MDT.2012.2213571","url":null,"abstract":"This article discusses a self-healing 60-GHz transceiver architecture which employs information collected from on-chip sensors to intelligently adjust various tuning knobs and significantly improve the post-healing performance yield.","PeriodicalId":50392,"journal":{"name":"IEEE Design & Test of Computers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2012-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/MDT.2012.2213571","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62470217","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 14
Pioneering in Asia With the US Venture Capital Model 以美国风险投资模式开拓亚洲市场
IEEE Design & Test of Computers Pub Date : 2012-12-01 DOI: 10.1109/MDT.2012.2221003
E. Marinissen
{"title":"Pioneering in Asia With the US Venture Capital Model","authors":"E. Marinissen","doi":"10.1109/MDT.2012.2221003","DOIUrl":"https://doi.org/10.1109/MDT.2012.2221003","url":null,"abstract":"Presents an interview conducted with Lip-Bu Tan, President and CEO of Cadence Design Systems.","PeriodicalId":50392,"journal":{"name":"IEEE Design & Test of Computers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2012-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78300845","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Guest Editors' Introduction: Digitally Enhanced Wireless Transceivers 客座编辑介绍:数字增强无线收发器
IEEE Design & Test of Computers Pub Date : 2012-12-01 DOI: 10.1109/MDT.2012.2222831
H. Stratigopoulos, A. Valdes-Garcia
{"title":"Guest Editors' Introduction: Digitally Enhanced Wireless Transceivers","authors":"H. Stratigopoulos, A. Valdes-Garcia","doi":"10.1109/MDT.2012.2222831","DOIUrl":"https://doi.org/10.1109/MDT.2012.2222831","url":null,"abstract":"This special issue of IEEE Design & Test of Computers provides an overview of the challenges, current practice, and future research directions of digitally enhanced wireless systems. The author provides an overview of the technical articles and features presented.","PeriodicalId":50392,"journal":{"name":"IEEE Design & Test of Computers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2012-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81351041","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Mixed-Signal SoCs With In Situ Self-Healing Circuitry 具有原位自愈电路的混合信号soc
IEEE Design & Test of Computers Pub Date : 2012-12-01 DOI: 10.1109/MDT.2012.2226014
C. Maxey, S. Raman, K. Groves, T. Quach, P. Orlando, A. Mattamana, G. Creech, J. Rockway
{"title":"Mixed-Signal SoCs With In Situ Self-Healing Circuitry","authors":"C. Maxey, S. Raman, K. Groves, T. Quach, P. Orlando, A. Mattamana, G. Creech, J. Rockway","doi":"10.1109/MDT.2012.2226014","DOIUrl":"https://doi.org/10.1109/MDT.2012.2226014","url":null,"abstract":"This article discusses the goals and recent achievements of the HEALICs program. The program's aim is to enhance wireless systems with sensors, actuators, and mixed-signal control loops in order to improve their performance yield.","PeriodicalId":50392,"journal":{"name":"IEEE Design & Test of Computers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2012-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/MDT.2012.2226014","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62470126","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 22
Predicting the future of information technology and society [The Road Ahead] 预测资讯科技与社会的未来[前路]
IEEE Design & Test of Computers Pub Date : 2012-12-01 DOI: 10.1109/MDT.2012.2228599
A. Kahng
{"title":"Predicting the future of information technology and society [The Road Ahead]","authors":"A. Kahng","doi":"10.1109/MDT.2012.2228599","DOIUrl":"https://doi.org/10.1109/MDT.2012.2228599","url":null,"abstract":"A year ago, this column contemplated the road ahead for semiconductor-based products that build on basic design, test, process, and device technologies. In late 2011, a workshop on the \"Future of IT and Society\" presented several broad visions of how societal changes will build on semiconductor-based products and information technology in such contexts as social mobility, healthcare, security, and mankind's relationship to the environment. Prediction of \"the road ahead\" at a societal level - with a meaningful time horizon (and with causal connections to underlying product roadmaps that connect, in turn, to underlying technology roadmaps) - presents a daunting, yet invaluable goal for researchers, governments, and entrepreneurs alike. The author then discusses predictions for IT and society - right and wrong; how well can we predict the future; and how will we predict the future of IT and society. He ends by noting that he believes that a true \"science of futurism\" will be developed within the next decade. Not only are there strong incentives to better model and predict the interplay between information technology and human society, but there is a steady stream of enabling techniques from big data, machine learning, modeling, and simulation.","PeriodicalId":50392,"journal":{"name":"IEEE Design & Test of Computers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2012-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77254286","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Bringing up a chip on the cheap 用廉价的筹码
IEEE Design & Test of Computers Pub Date : 2012-12-01 DOI: 10.1109/MDT.2011.2179849
Megan Wachs, Ofer Shacham, Zain Asgar, A. Firoozshahian, S. Richardson, M. Horowitz
{"title":"Bringing up a chip on the cheap","authors":"Megan Wachs, Ofer Shacham, Zain Asgar, A. Firoozshahian, S. Richardson, M. Horowitz","doi":"10.1109/MDT.2011.2179849","DOIUrl":"https://doi.org/10.1109/MDT.2011.2179849","url":null,"abstract":"Booting and debugging the functionality of silicon samples are known to be challenging and time-consuming tasks, even more so in cost-constrained environments. The authors describe their creative solutions used to bring up Stanford Smart Memories (SSM), a 55-million transistor research chip.","PeriodicalId":50392,"journal":{"name":"IEEE Design & Test of Computers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2012-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/MDT.2011.2179849","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62468843","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Towards more digital content in wireless systems [From the EiC] 向无线系统提供更多数字内容[来自EiC]
IEEE Design & Test of Computers Pub Date : 2012-12-01 DOI: 10.1109/MDT.2012.2228601
K. Chakrabarty
{"title":"Towards more digital content in wireless systems [From the EiC]","authors":"K. Chakrabarty","doi":"10.1109/MDT.2012.2228601","DOIUrl":"https://doi.org/10.1109/MDT.2012.2228601","url":null,"abstract":"This issue of IEEE Design & Test of Computers is focused on the theme of digitally enhanced wireless systems. Guest Editors Haralampos Stratigopoulos and Alberto Valdes-Garcia have worked diligently to put together this special issue with a set of four selected articles, which were selected after peer review from a larger set of submitted papers. These articles include a survey and look-ahead to the future, direct-sampling receiver design, self-healing in mixed-signal SOCs, and self-healing transceiver architectures. This issue also includes five nontheme articles and, after a long hiatus, an Interview column featuring Lip-Bu Tan, the President and CEO of Cadence Design Systems. The Standards and The Road Ahead columns are also included.","PeriodicalId":50392,"journal":{"name":"IEEE Design & Test of Computers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2012-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74837469","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Analyzing the Impact of Intermittent Faults on Microprocessors Applying Fault Injection 应用故障注入分析间歇故障对微处理器的影响
IEEE Design & Test of Computers Pub Date : 2012-12-01 DOI: 10.1109/MDT.2011.2179514
D. Gil, J. Gracia, J. Baraza-Calvo, L. J. Saiz, P. Gil
{"title":"Analyzing the Impact of Intermittent Faults on Microprocessors Applying Fault Injection","authors":"D. Gil, J. Gracia, J. Baraza-Calvo, L. J. Saiz, P. Gil","doi":"10.1109/MDT.2011.2179514","DOIUrl":"https://doi.org/10.1109/MDT.2011.2179514","url":null,"abstract":"Intermittent faults, being serious concerns for deep-submicron integrated circuits, are not well studied in the literature. This paper performs fault injection simulation to analyze the impact of intermittent faults, which is an important step towards the development of mitigation techniques for such threats.","PeriodicalId":50392,"journal":{"name":"IEEE Design & Test of Computers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2012-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/MDT.2011.2179514","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62468835","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 16
Surrogate Model-Based Self-Calibrated Design for Process and Temperature Compensation in Analog/RF Circuits 基于代理模型的模拟/射频电路过程和温度补偿自校准设计
IEEE Design & Test of Computers Pub Date : 2012-12-01 DOI: 10.1109/MDT.2012.2220332
Ting Zhu, M. Steer, P. Franzon
{"title":"Surrogate Model-Based Self-Calibrated Design for Process and Temperature Compensation in Analog/RF Circuits","authors":"Ting Zhu, M. Steer, P. Franzon","doi":"10.1109/MDT.2012.2220332","DOIUrl":"https://doi.org/10.1109/MDT.2012.2220332","url":null,"abstract":"Analog circuits designed in submicrometer nodes suffer from process variations, typically requiring calibration in order to center their performance parameters and to recover yield loss. This article presents a design flow to find appropriate tuning knob settings to compensate for different process variation scenarios.","PeriodicalId":50392,"journal":{"name":"IEEE Design & Test of Computers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2012-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/MDT.2012.2220332","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62469953","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Digitally intensive receiver design: opportunities and challenges 数字密集型接收机设计:机遇与挑战
IEEE Design & Test of Computers Pub Date : 2012-12-01 DOI: 10.1109/MDT.2012.2214756
R. Nanda, D. Markovic
{"title":"Digitally intensive receiver design: opportunities and challenges","authors":"R. Nanda, D. Markovic","doi":"10.1109/MDT.2012.2214756","DOIUrl":"https://doi.org/10.1109/MDT.2012.2214756","url":null,"abstract":"This article discusses the trade-offs involved in the implementation of a highly digital receiver and then describes a direct-sampling architecture which provides a wide range of runtime adaptability by varying parameters such as sample rate, filter order, and interpolation factor.","PeriodicalId":50392,"journal":{"name":"IEEE Design & Test of Computers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2012-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/MDT.2012.2214756","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62470313","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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