{"title":"基于代理模型的模拟/射频电路过程和温度补偿自校准设计","authors":"Ting Zhu, M. Steer, P. Franzon","doi":"10.1109/MDT.2012.2220332","DOIUrl":null,"url":null,"abstract":"Analog circuits designed in submicrometer nodes suffer from process variations, typically requiring calibration in order to center their performance parameters and to recover yield loss. This article presents a design flow to find appropriate tuning knob settings to compensate for different process variation scenarios.","PeriodicalId":50392,"journal":{"name":"IEEE Design & Test of Computers","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2012-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/MDT.2012.2220332","citationCount":"3","resultStr":"{\"title\":\"Surrogate Model-Based Self-Calibrated Design for Process and Temperature Compensation in Analog/RF Circuits\",\"authors\":\"Ting Zhu, M. Steer, P. Franzon\",\"doi\":\"10.1109/MDT.2012.2220332\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Analog circuits designed in submicrometer nodes suffer from process variations, typically requiring calibration in order to center their performance parameters and to recover yield loss. This article presents a design flow to find appropriate tuning knob settings to compensate for different process variation scenarios.\",\"PeriodicalId\":50392,\"journal\":{\"name\":\"IEEE Design & Test of Computers\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1109/MDT.2012.2220332\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Design & Test of Computers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MDT.2012.2220332\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Design & Test of Computers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MDT.2012.2220332","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Surrogate Model-Based Self-Calibrated Design for Process and Temperature Compensation in Analog/RF Circuits
Analog circuits designed in submicrometer nodes suffer from process variations, typically requiring calibration in order to center their performance parameters and to recover yield loss. This article presents a design flow to find appropriate tuning knob settings to compensate for different process variation scenarios.
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