Megan Wachs, Ofer Shacham, Zain Asgar, A. Firoozshahian, S. Richardson, M. Horowitz
{"title":"用廉价的筹码","authors":"Megan Wachs, Ofer Shacham, Zain Asgar, A. Firoozshahian, S. Richardson, M. Horowitz","doi":"10.1109/MDT.2011.2179849","DOIUrl":null,"url":null,"abstract":"Booting and debugging the functionality of silicon samples are known to be challenging and time-consuming tasks, even more so in cost-constrained environments. The authors describe their creative solutions used to bring up Stanford Smart Memories (SSM), a 55-million transistor research chip.","PeriodicalId":50392,"journal":{"name":"IEEE Design & Test of Computers","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2012-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/MDT.2011.2179849","citationCount":"3","resultStr":"{\"title\":\"Bringing up a chip on the cheap\",\"authors\":\"Megan Wachs, Ofer Shacham, Zain Asgar, A. Firoozshahian, S. Richardson, M. Horowitz\",\"doi\":\"10.1109/MDT.2011.2179849\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Booting and debugging the functionality of silicon samples are known to be challenging and time-consuming tasks, even more so in cost-constrained environments. The authors describe their creative solutions used to bring up Stanford Smart Memories (SSM), a 55-million transistor research chip.\",\"PeriodicalId\":50392,\"journal\":{\"name\":\"IEEE Design & Test of Computers\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1109/MDT.2011.2179849\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Design & Test of Computers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MDT.2011.2179849\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Design & Test of Computers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MDT.2011.2179849","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Booting and debugging the functionality of silicon samples are known to be challenging and time-consuming tasks, even more so in cost-constrained environments. The authors describe their creative solutions used to bring up Stanford Smart Memories (SSM), a 55-million transistor research chip.
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