{"title":"High-Q Whispering Gallery Modes in Wet Etched Silica Microdisk Resonators Containing Silicon Nanocrystals","authors":"R. Kekatpure, M. Brongersma","doi":"10.1109/GROUP4.2006.1708152","DOIUrl":"https://doi.org/10.1109/GROUP4.2006.1708152","url":null,"abstract":"We demonstrate coupling of room temperature photoluminescence (PL) emission from silicon nanocrystals (nc-Si) embedded in silicon-rich silicon oxide (SRSO) to whispering gallery modes (WGMs) of 10 mum radius microdisk resonators. The resonators were fabricated by wet chemical etching of circular patterns defined by electron beam lithography and display very smooth edges. We observe nearly degenerate counter-propagating WGMs from the microdisks and measure quality factors of Q>3500 for the fundamental mode at 850 nm - limited by the absorption loss from the nanocrystals","PeriodicalId":342599,"journal":{"name":"3rd IEEE International Conference on Group IV Photonics, 2006.","volume":"83 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117107330","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
I. Hsieh, X. Chen, J. Dadap, N. Panoiu, R. Osgood, S. Mcnab, Y. Vlasov
{"title":"Self-Phase Modulation of Femtosecond Pulses in Photonic Wire Waveguides","authors":"I. Hsieh, X. Chen, J. Dadap, N. Panoiu, R. Osgood, S. Mcnab, Y. Vlasov","doi":"10.1109/GROUP4.2006.1708224","DOIUrl":"https://doi.org/10.1109/GROUP4.2006.1708224","url":null,"abstract":"We use femtosecond pulses propagating inside a submicron cross-section Si photonic-wire waveguide to demonstrate strong interaction between self-phase modulation and dispersion effects, and provide comparison to a full theoretical analysis","PeriodicalId":342599,"journal":{"name":"3rd IEEE International Conference on Group IV Photonics, 2006.","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122028252","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
S.J. Specter, T. Lyszczarz, M. Geis, D. Lennon, J. Yoon, M. Grein, R. Schulein, F. Gan, F. Kaertner
{"title":"Low-Power, High-Speed Mach-Zehnder Modulator in Silicon","authors":"S.J. Specter, T. Lyszczarz, M. Geis, D. Lennon, J. Yoon, M. Grein, R. Schulein, F. Gan, F. Kaertner","doi":"10.1109/GROUP4.2006.1708200","DOIUrl":"https://doi.org/10.1109/GROUP4.2006.1708200","url":null,"abstract":"A high speed diode-based optical modulator has been fabricated in silicon. This device achieves an extremely low VpiL of 0.02 V-cm from 10-100 MHz. Modulation depths of 30% have been achieved at an input power of 100 mW at 5 GHz","PeriodicalId":342599,"journal":{"name":"3rd IEEE International Conference on Group IV Photonics, 2006.","volume":"49 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127687078","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
D. Thomson, G. Reed, F. Gardes, G. Mashanovich, S. Howe
{"title":"Introducing Carrier Localisation in Total Internal Reflection Optical Switches to Restrict Carrier Diffusion in the Guiding Layer","authors":"D. Thomson, G. Reed, F. Gardes, G. Mashanovich, S. Howe","doi":"10.1109/GROUP4.2006.1708171","DOIUrl":"https://doi.org/10.1109/GROUP4.2006.1708171","url":null,"abstract":"Previous total internal reflection based switches have suffered from the diffusion of carriers in the guiding layer leading to inefficient reflection and carrier injection. In our proposed device this problem is overcome by using a SiO2 barrier","PeriodicalId":342599,"journal":{"name":"3rd IEEE International Conference on Group IV Photonics, 2006.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126110017","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Densmore, D. Xu, P. Waldron, S. Janz, J. Lapointe, P. Cheben, A. Delâge, B. Lamontagne, J. Schmid, E. Post
{"title":"Evanescent field sensor using silicon-on-insulator photonic wires","authors":"A. Densmore, D. Xu, P. Waldron, S. Janz, J. Lapointe, P. Cheben, A. Delâge, B. Lamontagne, J. Schmid, E. Post","doi":"10.1109/GROUP4.2006.1708145","DOIUrl":"https://doi.org/10.1109/GROUP4.2006.1708145","url":null,"abstract":"A silicon-on-insulator based evanescent field sensor using silicon photonic wire waveguides is reported. The unique properties of high index contrast, submicron structures are exploited to enhance electric field magnitude and localization near the sensor surface. The evanescent field sensor is demonstrated in a Mach Zehnder configuration.","PeriodicalId":342599,"journal":{"name":"3rd IEEE International Conference on Group IV Photonics, 2006.","volume":"94 4","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114042577","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Temperature-Dependent Carrier Recombination Processes in Nanocrystalline Si/SiO2 Multi-Layers Studied by Time-Resolved and Time-Integrated Photoluminescence","authors":"S. Choi, Sung Kim, Y. Park, K. Kim","doi":"10.1109/GROUP4.2006.1708177","DOIUrl":"https://doi.org/10.1109/GROUP4.2006.1708177","url":null,"abstract":"In this study, ion beam sputtering deposition (IBSD) has been used to fabricate 50-period SiO2/SiOx multilayers, which have been subsequently annealed to form Si nanocrystals (NCs) in the SiOx layer. We report interesting correlation of temperature-dependent integrated PL intensity with the PL lifetime at each x value (NC size) and discuss possible mechanisms to explain the experimental results","PeriodicalId":342599,"journal":{"name":"3rd IEEE International Conference on Group IV Photonics, 2006.","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127574145","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Monolithic, Bufferless AlGaSb Emitters on Si based on Interfacial Misfit Arrays","authors":"D. Huffaker","doi":"10.1109/GROUP4.2006.1708216","DOIUrl":"https://doi.org/10.1109/GROUP4.2006.1708216","url":null,"abstract":"In this paper a monolithic, bufferless approach to III-V devices on Si substrates based on a self-assembled array of 90deg interfacial misfits (IMF) is discussed. This growth method, based on III-Sb, is fundamentally different from previously reported approaches since the strain energy due to the 13% lattice mismatch is fully and immediately relieved at the III-V interface rather than tetragonal distortion followed by defect formation as in III-As on Si","PeriodicalId":342599,"journal":{"name":"3rd IEEE International Conference on Group IV Photonics, 2006.","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127785684","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
P. Cheben, B. Lamontagne, E. Post, S. Janz, D. Xu, A. Delâge
{"title":"Out-of-Plane Total Internal Reflection Coupling Mirrors in Silicon-on-Insulator Ridge Waveguides","authors":"P. Cheben, B. Lamontagne, E. Post, S. Janz, D. Xu, A. Delâge","doi":"10.1109/GROUP4.2006.1708194","DOIUrl":"https://doi.org/10.1109/GROUP4.2006.1708194","url":null,"abstract":"We describe the fabrication and performance of out-of-plane coupling mirrors in silicon-on-insulator (SOI) ridge waveguides. The mirrors consisted of a 45deg facet formed using directional CAIBE etching through a lithographically defined window","PeriodicalId":342599,"journal":{"name":"3rd IEEE International Conference on Group IV Photonics, 2006.","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131216985","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Active Microring Resonator Devices in Silicon-on-Insulator","authors":"R. Soref","doi":"10.1109/GROUP4.2006.1708150","DOIUrl":"https://doi.org/10.1109/GROUP4.2006.1708150","url":null,"abstract":"Recent results from several laboratories are surveyed. The topics include SOI-based ultrafast electrooptical modulators, NtimesN routing switches, tunable filters-and-add/drops, Raman lasers and amplifiers, electrically pumped group IV lasers, optically pumped Er:SiO2-overclad slotted rings, and a variety of nonlinear optical devices","PeriodicalId":342599,"journal":{"name":"3rd IEEE International Conference on Group IV Photonics, 2006.","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134589007","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Polarization State of Silicon Raman Lasers Dictated by Non-Degenerate Two-Photon Absorption","authors":"E. Tien, O. Boyraz","doi":"10.1109/GROUP4.2006.1708164","DOIUrl":"https://doi.org/10.1109/GROUP4.2006.1708164","url":null,"abstract":"In this paper, we demonstrate the polarization state of the silicon Raman lasers dictated by the non-degenerate two-photon absorption (TPA) process. We measure that the lasing in silicon waveguides can be achieved when pump and signal have linear and orthogonal polarization states relative to each other or circular polarization states. Pump-signal TPA increases the loss inside the resonator significantly and does not allow lasing when they have collinear polarization states. We measure the average lasing threshold power to be 12.5 mW for orthogonal polarization states and it is increased by 12% (to 14 mW) by adjusting the pump-signal polarization states to circular polarization. Experimental results reveal that the degenerate TPA will mitigate the higher order Raman lasing in silicon waveguides for wavelengths below 2 mum because of non-degenerate TPA process","PeriodicalId":342599,"journal":{"name":"3rd IEEE International Conference on Group IV Photonics, 2006.","volume":"63 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127576491","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}