Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223)最新文献_第4页

Systematic AUED codes for self-checking architectures 用于自检架构的系统AUED代码

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) Pub Date : 1998-11-02 DOI: 10.1109/DFTVS.1998.732165

D. Sciuto, C. Silvano, R. Stefanelli

引用次数: 2

Reducing fault sensitivity of microprocessor-based systems by modifying workload structure 通过调整工作负载结构来降低微处理器系统的故障敏感性

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) Pub Date : 1998-11-02 DOI: 10.1109/DFTVS.1998.732172

D. Audet, S. Masson, Y. Savaria

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引用次数: 7

Yield and routing objectives in floorplanning 楼层规划中的产量和路线目标

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) Pub Date : 1998-11-02 DOI: 10.1109/DFTVS.1998.732148

I. Koren, Z. Koren

引用次数: 7

Transient and intermittent fault recovery without rollback 无回滚的瞬时间歇故障恢复

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) Pub Date : 1998-11-02 DOI: 10.1109/DFTVS.1998.732173

S. Hamilton, A. Orailoglu

引用次数: 9

Self-reconfiguration scheme of 3D-mesh arrays 三维网格阵列的自重构方案

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) Pub Date : 1998-11-02 DOI: 10.1109/DFTVS.1998.732176

S. Horiguchi, I. Numata

引用次数: 4

Fault-tolerant voting mechanism and recovery scheme for TMR FPGA-based systems 基于TMR fpga系统的容错投票机制与恢复方案

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) Pub Date : 1998-11-02 DOI: 10.1109/DFTVS.1998.732171

S. D'Angelo, C. Metra, S. Pastore, A. Pogutz, G. Sechi

引用次数: 41

Yield enhancement by multi-level linear modeling of non-idealities in an interpolated flash ADC 内插式快闪ADC中非理想性的多级线性建模提高良率

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) Pub Date : 1998-11-02 DOI: 10.1109/DFTVS.1998.732182

A. Boni, A. Pierazzi

引用次数: 1

An integrated HW and SW fault injection environment for real-time systems 实时系统的集成硬件和软件故障注入环境

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) Pub Date : 1998-11-02 DOI: 10.1109/DFTVS.1998.732158

A. Benso, M. Rebaudengo, M. Reorda, P. Civera

引用次数: 21

Characterization of CMOS defects using transient signal analysis 利用瞬态信号分析表征CMOS缺陷

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) Pub Date : 1998-11-02 DOI: 10.1109/DFTVS.1998.732155

J. Plusquellic, D. Chiarulli, S. Levitan

引用次数: 10

Challenges of built-in current sensor designs 内置电流传感器设计的挑战

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) Pub Date : 1998-11-02 DOI: 10.1109/DFTVS.1998.732166

Yu-Yau Guo, Jien-Chung Lo

引用次数: 1