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Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223)最新文献

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Process variations and their impact on circuit operation 工艺变化及其对电路运行的影响
Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) Pub Date : 1998-11-02 DOI: 10.1109/DFTVS.1998.732153
S. Natarajan, M. Breuer, S. Gupta
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引用次数: 72
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