{"title":"楼层规划中的产量和路线目标","authors":"I. Koren, Z. Koren","doi":"10.1109/DFTVS.1998.732148","DOIUrl":null,"url":null,"abstract":"Traditionally the floorplan of a chip has been determined so as to minimize the total chip area and reduce the routing costs. Recently, it has been shown that the floorplan also affects the yield of the chip. Consequently, it becomes desirable to consider the expected yield, in addition to the cost of routing, when selecting a floorplan. The goal of this paper is to study the two seemingly disjoint objectives of yield enhancement and routing complexity minimization, and find out whether they lead to different optimal floorplans, resulting in a need for a tradeoff analysis.","PeriodicalId":245879,"journal":{"name":"Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223)","volume":"349 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Yield and routing objectives in floorplanning\",\"authors\":\"I. Koren, Z. Koren\",\"doi\":\"10.1109/DFTVS.1998.732148\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Traditionally the floorplan of a chip has been determined so as to minimize the total chip area and reduce the routing costs. Recently, it has been shown that the floorplan also affects the yield of the chip. Consequently, it becomes desirable to consider the expected yield, in addition to the cost of routing, when selecting a floorplan. The goal of this paper is to study the two seemingly disjoint objectives of yield enhancement and routing complexity minimization, and find out whether they lead to different optimal floorplans, resulting in a need for a tradeoff analysis.\",\"PeriodicalId\":245879,\"journal\":{\"name\":\"Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223)\",\"volume\":\"349 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-11-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFTVS.1998.732148\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.1998.732148","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Traditionally the floorplan of a chip has been determined so as to minimize the total chip area and reduce the routing costs. Recently, it has been shown that the floorplan also affects the yield of the chip. Consequently, it becomes desirable to consider the expected yield, in addition to the cost of routing, when selecting a floorplan. The goal of this paper is to study the two seemingly disjoint objectives of yield enhancement and routing complexity minimization, and find out whether they lead to different optimal floorplans, resulting in a need for a tradeoff analysis.
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