W. Quan, A. Arabhavi, D. Marti, S. Hamzeloui, O. Ostinelli, C. Bolognesi
{"title":"InP/GaAsSb DHBT Power Performance with 30% Class-A PAE at 94 GHz","authors":"W. Quan, A. Arabhavi, D. Marti, S. Hamzeloui, O. Ostinelli, C. Bolognesi","doi":"10.1109/BCICTS45179.2019.8972718","DOIUrl":"https://doi.org/10.1109/BCICTS45179.2019.8972718","url":null,"abstract":"The present work characterizes the 94 GHz class-A large-signal load-pull performance of mm-wave InP/GaAsSb double heterojunction bipolar transistors (DHBTs) with different emitter lengths LE. When matched for maximum power, a 10.3 dBm (1.09 mW/μm) output is realized in a 10 μm transistor with a 24.5 % power-added efficiency (PAE). When matched for maximum PAE, a 30% Class-A PAE is achieved in a 7.5 μm long device, with the simultaneous output power and power gain of 9.0 dBm and 5.9 dB. The load-pull contours exhibit a combination of good output power and high PAE for a wide range of load impedances in the vicinity of 50 Ohm. This makes InP/GaAsSb DHBTs very good candidates for power amplification well into the mm-wave range of frequencies.","PeriodicalId":243314,"journal":{"name":"2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124184990","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
B. Hassan, A. Cutivet, C. Rodriguez, Flavien Cozette, A. Soltani, H. Maher, F. Boone
{"title":"Scalable Small-Signal Modeling of AlGaN/GaN HEMT Based on Distributed Gate Resistance","authors":"B. Hassan, A. Cutivet, C. Rodriguez, Flavien Cozette, A. Soltani, H. Maher, F. Boone","doi":"10.1109/BCICTS45179.2019.8972776","DOIUrl":"https://doi.org/10.1109/BCICTS45179.2019.8972776","url":null,"abstract":"This paper reports on scalable small signal modeling of AlGaN/GaN high-electron-mobility transistors (HEMTs) based on distributed gate resistance model. A distributed gate resistance model (DGRM) is used to model large periphery of GaN HEMT with various gate widths. A fully scalable analytical small signal model is developed with the experimental results. Intrinsic parameters, independent of the frequency, have been shown. Furthermore, S-parameters are obtained from the modeling and measurements to verify the model. The good agreement between the measured and the simulated results indicate that this model is accurate, stable and comparatively more representative of the real evolution of local resistance in the gate. The proposed scalable DGRM would be useful for accurate scalable large signal modeling of large periphery GaN HEMTs for high power RF application.","PeriodicalId":243314,"journal":{"name":"2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS)","volume":"75 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125375797","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Moon-Kyu Cho, I. Song, N. Lourenco, A. Cardoso, C. Coen, D. Denison, J. Cressler
{"title":"A 2-20 GHz SiGe Amplitude Control Circuit with Differential Signal Selectivity for Wideband Reconfigurable Electronics","authors":"Moon-Kyu Cho, I. Song, N. Lourenco, A. Cardoso, C. Coen, D. Denison, J. Cressler","doi":"10.1109/BCICTS45179.2019.8972716","DOIUrl":"https://doi.org/10.1109/BCICTS45179.2019.8972716","url":null,"abstract":"This paper presents a wideband integrated single-tap circuit for a general-purpose, high-performance transversal filter application, and which has been implemented in silicon germanium (SiGe) technology for use in direct-throughput processing of RF signals in the microwave and millimeter-wave spectrum. To provide wideband instantaneous reconfigurability and multi-function RF capability, the proposed circuit consists of a digital step attenuator, an active-based balun, a single-pole single-throw (SPDT) switch, and a digital control circuit. To achieve low noise characteristics for the receiver, a wideband low-noise amplifier (LNA) is included in the design. In addition, an active-based switchable power divider is utilized for supporting open-loop systems that provide a comparison with system set points or input signals. The proposed single-tap circuit demonstrates flat in-band gain of 14.3 dB with ±0.9 dB variation, 31.5 dB amplitude control range with 0.5 dB step, and a differential signal selectivity from 2 to 20 GHz. This single-tap circuit block is expected to enable a diverse set of tasks, including tunable RF front-end filtering, pre-linearization of signal for saturation compensation, and direct throughput matched filtering.","PeriodicalId":243314,"journal":{"name":"2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS)","volume":"179 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116705160","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
V. Issakov, Andrea Bilato, Vera Kurz, D. Englisch, A. Geiselbrechtinger
{"title":"A Highly Integrated D-Band Multi-Channel Transceiver Chip for Radar Applications","authors":"V. Issakov, Andrea Bilato, Vera Kurz, D. Englisch, A. Geiselbrechtinger","doi":"10.1109/BCICTS45179.2019.8972781","DOIUrl":"https://doi.org/10.1109/BCICTS45179.2019.8972781","url":null,"abstract":"This paper presents a low-power, highly-integrated D-Band transceiver chip realized in a 0.13 µm SiGe BiCMOS technology. The integration level includes three receiver (RX) channels, one transmitter (TX) channel, local oscillator (LO) signal generation and distribution network, frequency dividers and serial peripheral interface (SPI) for digital reconfigurability. The receiver achieves a peak gain of 14 dB at 118 GHz, while the transmitter achieves an output power of −6 dBm at 118 GHz. The VCO is realized in a push-push Colpitts topology. Additionally, its output is multiplied by two using a frequency doubler. Hence the transmitter output signal is continuously tunable in the frequency range 117 − 126 GHz, while achieving a measured phase noise of − 93.5 dBc /Hz at 1 MHz offset at 120 GHz. The entire transceiver draws 195 mA from a single 1.8 V supply. A single RX channel draws 19 mA, while a single TX consumes 25 mA. The circuit including pads occupies a chip area of only 3.5 mm × 2.75 mm, which is limited only by the separation necessary for isolation between the channels. The transceiver provides a competitive performance and is suitable for continuous-wave radar applications around 120 GHz.","PeriodicalId":243314,"journal":{"name":"2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122287150","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"TCAD simulation and assessment of anomalous deflection in measured S-parameters of SiGe HBTs in THz range","authors":"S. Panda, S. Frégonèse, A. Chakravorty, T. Zimmer","doi":"10.1109/BCICTS45179.2019.8972760","DOIUrl":"https://doi.org/10.1109/BCICTS45179.2019.8972760","url":null,"abstract":"In this paper, we have assessed the RF measurements of SiGe HBTs upto 500 GHz using TCAD simulation for the first time. In order to bring confidence in simulation, the device geometries and doping profiles are captured in the simulation deck. Then all the basic DC and RF properties are calibrated with the measured data for two different geometries. Additionally the simulated unilateral gain and small signal current gain are also brought in agreement with the corresponding measured data at different bias voltages for both the devices. Finally bias and frequency dependent S- parameter measurements are compared with the TCAD simulation and resulting issues are discussed.","PeriodicalId":243314,"journal":{"name":"2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130049229","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A 4.6V, 6-bit, 64GS/s Transmitter in 22nm FDSOI CMOS","authors":"Jashva Rafique, Thelinh Nguyen, S. Voinigescu","doi":"10.1109/BCICTS45179.2019.8972727","DOIUrl":"https://doi.org/10.1109/BCICTS45179.2019.8972727","url":null,"abstract":"A 6-bit large-swing, digital transmitter was implemented in a production 22nm FDSOI CMOS technology. It features a 35mA/4.8V series-stacked complementary differential DAC output stage with MOSFET gate finger segmentation and which operates in class-D switching mode. The 1.4 pJ/b efficiency output stage has 10 complementary inputs, 7 for the 3 thermometer-coded MSBs, and 3 for the binary-weighted LSBs, which are driven by 0.8V CMOS inverter chains switching at up to 66 Gb/s. Measurements of 4.6Vpp differential PAM-4 eye diagrams at 52 GBaud are reported using the on-chip PRBS7 generator. With external data signals from a 64Gb/s BERT and only 3/4 of the 7 thermometer-coded output-stage MSB sections switching, the transmitter achieves 56GBaud 5-PAM, 60GBaud 4-PAM, 62GBaud 3-PAM, and 66Gb/s NRZ operation. The transmitter consumes 450 mW, which includes the clock amplifier, PRBS7 generator, serializer, ten 66Gb/s input data paths matched to 50 Ω, and the large-swing 6-bit DAC output stage.","PeriodicalId":243314,"journal":{"name":"2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130356967","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Thermal analysis of semiconductor devices and materials - Why should I not trust a thermal simulation ?","authors":"M. Kuball, J. Pomeroy, F. Gucmann, Bahar Oner","doi":"10.1109/BCICTS45179.2019.8972763","DOIUrl":"https://doi.org/10.1109/BCICTS45179.2019.8972763","url":null,"abstract":"Semiconductor device temperature is challenging to measure; often IR thermography or electrical measurements are used which do not have a high enough spatial resolution for most of the current semiconductor technology to detect sub-micron size hot spots. Thermal simulation is often therefore used to predict peak device temperature. Limitations of thermal simulations are highlighted. Latest developments in the actual measurement of semiconductor device temperature with sub-micron spatial resolution including Raman Thermography, High Spatial Resolution Hyperspectral Quantum Rod Thermal Imaging, Thermal Atomic Force Microscopy, and thermoreflectance are detailed, which enable validation of thermal simulations.","PeriodicalId":243314,"journal":{"name":"2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128722711","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Z. Griffith, M. Urteaga, P. Rowell, L. Tran, B. Brar
{"title":"50 – 250 GHz High-Gain Power Amplifier MMICs in 250-nm InP HBT","authors":"Z. Griffith, M. Urteaga, P. Rowell, L. Tran, B. Brar","doi":"10.1109/BCICTS45179.2019.8972777","DOIUrl":"https://doi.org/10.1109/BCICTS45179.2019.8972777","url":null,"abstract":"In this paper we review the status of the state-of-the-art and our transition activities for mm-wave, D-, and G-band solid-state power amplifier (PA) MMICs developed into Teledyne Scientific’s 250-nm InP HBT technology. Key design decisions driven by the transistor gain at a given frequency and large-signal load-line are reviewed. Novel PA cell topologies are presented to show how they address the high current biasing required of the 250-nm InP HBT and permit 2× and 4× on-chip combining. PA wafer-mapping by auto-probing on a full thickness 100-mm wafer prior to finishing (thinning to 3-mil, chip singulation) permits the RF identification of known-good-die (KGD) and thus an inventory of parts can be generated. Five established 250-nm InP HBT power amplifiers are presented operating from 55-135 GHz (115-135 mW), 60-130 GHz (160-275 mW), 115-145 GHz (0.25-W @ 140-GHz), 115-185 GHz (75-115 mW), and 180-250 GHz (40-80 mW). Also, included is a novel 190-GHz low-power driver amplifier (high-gain, 100-mW PDC, 3-dBm OP1dB, 11-dBm Psat with 9.6% PAE).","PeriodicalId":243314,"journal":{"name":"2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134099723","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
S. Khandelwal, K. Kellogg, C. Hill, H. Morales, L. Dunleavy, G. Drandova, Anita Pacheco, J. Jimenez
{"title":"Quiescent Drain Voltage Dependence of Pulsed I-V Characteristics of GaN HEMTs: Analysis and Modeling","authors":"S. Khandelwal, K. Kellogg, C. Hill, H. Morales, L. Dunleavy, G. Drandova, Anita Pacheco, J. Jimenez","doi":"10.1109/BCICTS45179.2019.8972721","DOIUrl":"https://doi.org/10.1109/BCICTS45179.2019.8972721","url":null,"abstract":"This paper presents an analysis on the dependence of the pulsed I-V characteristics of GaN HEMTs under varying quiescent drain voltage (Vdsq) conditions, and a new model is developed for this behavior. It is found that three device parameters change with Vdsq: threshold (or cut-off) voltage, and 2-DEG densities in source and drain side access regions. It is shown that these device parameters have a non-linear dependence on Vdsq. The new model for this non-linear behavior w.r.t Vdsq is validated with measured data for six Vdsq 's for two different GaN technologies. The developed model is also exercised for large signal microwave frequency performance yielding good agreement with measurements and indicating the importance of modeling this trap-related device parameter change with Vdsq. Index Terms—MMIC, power amplifiers, Gallium Nitride, Compact models, GaN trapping effects.","PeriodicalId":243314,"journal":{"name":"2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134115721","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Modeling layout, distribution and breakdown effects in GaN HEMTs in the MVSG approach","authors":"K. A. Aabrar, Lan Wei, U. Radhakrishna","doi":"10.1109/BCICTS45179.2019.8972762","DOIUrl":"https://doi.org/10.1109/BCICTS45179.2019.8972762","url":null,"abstract":"In this work, we extend the industry standard MIT Virtual Source GaN HEMT (MVSG) model to include layout dependent effects such as scaling of parasitic fringing capacitances, scaling of distributed gate- and channel-resistance, and scaling of thermal network, which target wide-periphery FETs for high-frequency (HF) power amplification applications. Further, we capture the safe-operating area (SOA) of the device by including channel-breakdown in addition to gate-diode breakdown which is useful for high voltage (HV) applications. The modeling approach satisfies Gummel symmetry-benchmarks and is valid for symmetric switch FETs.","PeriodicalId":243314,"journal":{"name":"2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134206586","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}