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2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)最新文献

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Single Event Upset Characterization of the Intel Movidius Myriad X VPU and Google Edge TPU Accelerators Using Proton Irradiation 使用质子辐照的Intel Movidius Myriad X VPU和Google Edge TPU加速器的单事件扰动特性
2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC) Pub Date : 2022-07-01 DOI: 10.1109/REDW56037.2022.9921608
Devin P. Ramaswami, D. Hiemstra, Zhi Yang, S. Shi, L. Chen
{"title":"Single Event Upset Characterization of the Intel Movidius Myriad X VPU and Google Edge TPU Accelerators Using Proton Irradiation","authors":"Devin P. Ramaswami, D. Hiemstra, Zhi Yang, S. Shi, L. Chen","doi":"10.1109/REDW56037.2022.9921608","DOIUrl":"https://doi.org/10.1109/REDW56037.2022.9921608","url":null,"abstract":"Proton induced SEU cross-sections of the Movidius Myriad X VPU and Google Edge TPU are presented. Upset rates in the space radiation environment are estimated and found to be acceptable for low orbit missions.","PeriodicalId":202271,"journal":{"name":"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126090787","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Neutron and 64MeV Proton Characterization of Xilinx 7nm VersalTM Multicore Scalar Processing System (PS) Xilinx 7nm VersalTM多核标量处理系统(PS)的中子和64MeV质子表征
2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC) Pub Date : 2022-07-01 DOI: 10.1109/REDW56037.2022.9921497
P. Maillard, Y. P. Chen, Jue Arver, Venkatesh Merugu, Ava Shui, M. Voogel
{"title":"Neutron and 64MeV Proton Characterization of Xilinx 7nm VersalTM Multicore Scalar Processing System (PS)","authors":"P. Maillard, Y. P. Chen, Jue Arver, Venkatesh Merugu, Ava Shui, M. Voogel","doi":"10.1109/REDW56037.2022.9921497","DOIUrl":"https://doi.org/10.1109/REDW56037.2022.9921497","url":null,"abstract":"This paper presents the single event response of Xilinx’s 7nm Versal ACAP dual R5 and dual A72 ARM core processor (PS). The PS was evaluating using Xilinx System Validation Tool (SVT) design suite. Accelerated SEU beam test of a XCVC1902 device was performed using the 64MeV Proton source at Crocker Nuclear Laboratory (CNL) and at LANSCE. More than 5 million designs exercising covering all the PS power domains were generated. Single-event characterization results are presented and categorized in terms of detectability and correctability. Beam test results show that the overall Processor System (PS) SEFI FIT is $sim0.2$ at NYC sea level, with all safety mechanisms enabled and no uncorrectable events were observed in the PS caches and RAMs.","PeriodicalId":202271,"journal":{"name":"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)","volume":"85 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126932914","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Total Ionizing Dose and Reliability Evaluation of the ST-DDR4 Spin-transfer Torque Magnetoresistive Random Access Memory (STT-MRAM) ST-DDR4自旋转移转矩磁阻随机存取存储器(STT-MRAM)总电离剂量及可靠性评价
2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC) Pub Date : 2022-07-01 DOI: 10.1109/REDW56037.2022.9921476
Sergeh Vartanian, J. Yang-Scharlotta, G. Allen, A. Daniel, D. Costanzo, F. Mancoff, D. Symalla, Andy Olsen
{"title":"Total Ionizing Dose and Reliability Evaluation of the ST-DDR4 Spin-transfer Torque Magnetoresistive Random Access Memory (STT-MRAM)","authors":"Sergeh Vartanian, J. Yang-Scharlotta, G. Allen, A. Daniel, D. Costanzo, F. Mancoff, D. Symalla, Andy Olsen","doi":"10.1109/REDW56037.2022.9921476","DOIUrl":"https://doi.org/10.1109/REDW56037.2022.9921476","url":null,"abstract":"We present total ionizing dose (TID) evaluation of the Everspin Technologies 1Gb non-volatile ST-DDR4 spin-transfer torque MRAM, and its effects on the reliability of the magnetic tunnel junctions (MTJs).","PeriodicalId":202271,"journal":{"name":"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116392737","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Radiation Characterization Results of AP54RHC 30 krad(Si) Logic Family AP54RHC 30krad (Si)逻辑族辐射表征结果
2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC) Pub Date : 2022-07-01 DOI: 10.1109/REDW56037.2022.9921561
A. Ghoshal, A. Billings, M. Hamlyn, A. Quiroz, K. Schulmeyer
{"title":"Radiation Characterization Results of AP54RHC 30 krad(Si) Logic Family","authors":"A. Ghoshal, A. Billings, M. Hamlyn, A. Quiroz, K. Schulmeyer","doi":"10.1109/REDW56037.2022.9921561","DOIUrl":"https://doi.org/10.1109/REDW56037.2022.9921561","url":null,"abstract":"This paper details the Total Ionizing Dosage (TID), Single Event Latchup (SEL), and Single Event Transient (SET) characterization results for Apogee Semiconductor’s AP54RHC logic family. Results for TID up to 45krad (Si) and Single Event Effects (SEE) at a maximum LE$text{T}_{EFF}=74.7 text{MeV}cdot text{cm}^{2}$/mg are presented. The paper also presents SEE event rate calculations for LEO and GEO space applications using upper limit cross-sections with a 95% confidence interval. These results demonstrate that this device family is well suited for space applications.","PeriodicalId":202271,"journal":{"name":"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)","volume":"94 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114569390","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Total Dose Performance at High Dose Rate of Isolated Switching Regulator Evaluation Kits 隔离开关调节器评估试剂盒在高剂量率下的总剂量性能
2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC) Pub Date : 2022-07-01 DOI: 10.1109/REDW56037.2022.9921727
D. Hiemstra, S. Shi, L. Chen
{"title":"Total Dose Performance at High Dose Rate of Isolated Switching Regulator Evaluation Kits","authors":"D. Hiemstra, S. Shi, L. Chen","doi":"10.1109/REDW56037.2022.9921727","DOIUrl":"https://doi.org/10.1109/REDW56037.2022.9921727","url":null,"abstract":"Results of Cobalt-60 high dose rate irradiation of isolated switching regulator evaluation kits are provided. Their performance in the space radiation environment is discussed.","PeriodicalId":202271,"journal":{"name":"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129709371","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Single Event Characterization of Power Components under Heavy Ion Irradiation 重离子辐照下功率元件的单事件特性
2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC) Pub Date : 2022-07-01 DOI: 10.1109/REDW56037.2022.9921689
N. Aksteiner, J. Budroweit
{"title":"Single Event Characterization of Power Components under Heavy Ion Irradiation","authors":"N. Aksteiner, J. Budroweit","doi":"10.1109/REDW56037.2022.9921689","DOIUrl":"https://doi.org/10.1109/REDW56037.2022.9921689","url":null,"abstract":"Three different power conversion and control devices were characterized for single event effects under heavy ion irradiation. Two samples of the LT3007 LDO showed many transients and one sample broke. A single sample of the LT8610 Buck converter was tested and showed significant transients. The final device was the ADM1270 hot-swap controller, which showed various single event effects.","PeriodicalId":202271,"journal":{"name":"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)","volume":"81 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126241450","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Laser Techniques for Mitigation of Single Event Effects in a PWM Controller 缓解PWM控制器中单事件效应的激光技术
2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC) Pub Date : 2022-07-01 DOI: 10.1109/REDW56037.2022.9921498
T. Bernard, E. Thomson, L. Pearce, Tim Hoang-Lok, Abigail Eberts
{"title":"Laser Techniques for Mitigation of Single Event Effects in a PWM Controller","authors":"T. Bernard, E. Thomson, L. Pearce, Tim Hoang-Lok, Abigail Eberts","doi":"10.1109/REDW56037.2022.9921498","DOIUrl":"https://doi.org/10.1109/REDW56037.2022.9921498","url":null,"abstract":"In this paper, we present the results of the Buck PWM Controller Single Event Functional Interrupts (SEFI) on the initial silicon, and the efforts to discover root cause of the SEFI/SET through diagnostic testing, design simulations, and laser testing. This helped improve the results on revised silicon in significantly reducing the SEFI/SET cross-section. The Buck PWM Controller is designed on a 250nm CMOS process using Radiation Hardened circuit design and layout techniques.","PeriodicalId":202271,"journal":{"name":"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)","volume":"105 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133225631","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Combined Neutron and TID Results of the Intersil ISL70321SEH Intersil ISL70321SEH的中子和TID联合结果
2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC) Pub Date : 2022-07-01 DOI: 10.1109/REDW56037.2022.9921500
W. H. Newman, N. V. van Vonno, S. D. Turner, L. Pearce
{"title":"Combined Neutron and TID Results of the Intersil ISL70321SEH","authors":"W. H. Newman, N. V. van Vonno, S. D. Turner, L. Pearce","doi":"10.1109/REDW56037.2022.9921500","DOIUrl":"https://doi.org/10.1109/REDW56037.2022.9921500","url":null,"abstract":"We report the combined results of the ISL70321SEH after exposure to 5 $mathrm{x}10^{11},2mathrm{x}10^{12}$, and 1 $mathrm{x}10^{13}$ 1MeV equivalent neutrons/$mathrm{c}mathrm{m}^{2}$ followed by 100 krad(Si) HDR total ionizing dose.","PeriodicalId":202271,"journal":{"name":"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)","volume":"129 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126179902","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Heavy-Ion Single-Event Effects Test Facility at Michigan State University 密歇根州立大学重离子单事件效应测试设施
2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC) Pub Date : 2022-07-01 DOI: 10.1109/REDW56037.2022.9921718
S. Lidia, S. Cogan, K. Fukushima, T. Gee, S.-H. Kim, G. Machicoane, T. Maruta, D. McNanney, P. Ostroumov, A. Plastun, X. Rao, S. Rodriguez, A. Yeck, Q. Zhao
{"title":"A Heavy-Ion Single-Event Effects Test Facility at Michigan State University","authors":"S. Lidia, S. Cogan, K. Fukushima, T. Gee, S.-H. Kim, G. Machicoane, T. Maruta, D. McNanney, P. Ostroumov, A. Plastun, X. Rao, S. Rodriguez, A. Yeck, Q. Zhao","doi":"10.1109/REDW56037.2022.9921718","DOIUrl":"https://doi.org/10.1109/REDW56037.2022.9921718","url":null,"abstract":"Michigan State University has commissioned a new SEE test facility based on the recently completed Facility for Rare Isotope Beams superconducting LINAC. We review the facility design, capabilities, and commissioning status.","PeriodicalId":202271,"journal":{"name":"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124855916","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
First Extensive Radiation Characterization of Double Capacitive SiO2 Isolation Barrier Technology using TI’s ISOS141-SEP as a Test Vehicle 首次使用TI的iso141 - sep作为测试载体对双电容性SiO2隔离屏障技术进行广泛的辐射表征
2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC) Pub Date : 2022-07-01 DOI: 10.1109/REDW56037.2022.9921574
Michael Saul, R. Gooty, Samantha Williams, Sadia Khan, Khodor S. Elnashar
{"title":"First Extensive Radiation Characterization of Double Capacitive SiO2 Isolation Barrier Technology using TI’s ISOS141-SEP as a Test Vehicle","authors":"Michael Saul, R. Gooty, Samantha Williams, Sadia Khan, Khodor S. Elnashar","doi":"10.1109/REDW56037.2022.9921574","DOIUrl":"https://doi.org/10.1109/REDW56037.2022.9921574","url":null,"abstract":"Double Capacitive $text{S}text{i}text{O}_{2}$ Isolation is the modern system isolation solution with improved radiation results such as Single Event Latchup, Single Event Dielectric Rupture, Total Ionizing Dose, and Neutron Displacement Damage.","PeriodicalId":202271,"journal":{"name":"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)","volume":"29 11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125692176","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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