Neutron and 64MeV Proton Characterization of Xilinx 7nm VersalTM Multicore Scalar Processing System (PS)

Abstract

This paper presents the single event response of Xilinx’s 7nm Versal ACAP dual R5 and dual A72 ARM core processor (PS). The PS was evaluating using Xilinx System Validation Tool (SVT) design suite. Accelerated SEU beam test of a XCVC1902 device was performed using the 64MeV Proton source at Crocker Nuclear Laboratory (CNL) and at LANSCE. More than 5 million designs exercising covering all the PS power domains were generated. Single-event characterization results are presented and categorized in terms of detectability and correctability. Beam test results show that the overall Processor System (PS) SEFI FIT is $\sim0.2$ at NYC sea level, with all safety mechanisms enabled and no uncorrectable events were observed in the PS caches and RAMs.