缓解PWM控制器中单事件效应的激光技术

2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC) Pub Date : 2022-07-01 DOI:10.1109/REDW56037.2022.9921498

T. Bernard, E. Thomson, L. Pearce, Tim Hoang-Lok, Abigail Eberts

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引用次数: 0

摘要

在本文中，我们介绍了Buck PWM控制器单事件功能中断(SEFI)在初始硅上的结果，并通过诊断测试、设计模拟和激光测试来发现SEFI/SET的根本原因。这有助于改善改性硅的结果，显著降低了SEFI/SET截面。Buck PWM控制器采用辐射硬化电路设计和布局技术，采用250nm CMOS工艺设计。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Laser Techniques for Mitigation of Single Event Effects in a PWM Controller

In this paper, we present the results of the Buck PWM Controller Single Event Functional Interrupts (SEFI) on the initial silicon, and the efforts to discover root cause of the SEFI/SET through diagnostic testing, design simulations, and laser testing. This helped improve the results on revised silicon in significantly reducing the SEFI/SET cross-section. The Buck PWM Controller is designed on a 250nm CMOS process using Radiation Hardened circuit design and layout techniques.

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来源期刊

2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)

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