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2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)最新文献

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A Study of Neutron Induced Single-Event Damage in AlGaN/GaN HEMTs 中子诱导的AlGaN/GaN hemt单事件损伤研究
2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC) Pub Date : 2022-07-01 DOI: 10.1109/REDW56037.2022.9921516
Han Gao, Danyal Ahsanullah, R. Baumann, B. Gnade
{"title":"A Study of Neutron Induced Single-Event Damage in AlGaN/GaN HEMTs","authors":"Han Gao, Danyal Ahsanullah, R. Baumann, B. Gnade","doi":"10.1109/REDW56037.2022.9921516","DOIUrl":"https://doi.org/10.1109/REDW56037.2022.9921516","url":null,"abstract":"GaN power device lifetime degradation caused by neutron irradiation is reported. Hundreds of devices were stressed in off-state with various drain voltages from 75 V to 400 V while irradiated with a high intensity neutron beam. Observing a statistically significant number of neutron-induced destructive single-event-effects (DSEEs) enabled an accurate extrapolation of terrestrial field failure rates.","PeriodicalId":202271,"journal":{"name":"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132979651","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Neutron-Induced SEEs in the Xilinx Versal Prime Xilinx Versal Prime中的中子诱导see
2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC) Pub Date : 2022-07-01 DOI: 10.1109/REDW56037.2022.9921523
H. Quinn, C. Corley, P. Thelen
{"title":"Neutron-Induced SEEs in the Xilinx Versal Prime","authors":"H. Quinn, C. Corley, P. Thelen","doi":"10.1109/REDW56037.2022.9921523","DOIUrl":"https://doi.org/10.1109/REDW56037.2022.9921523","url":null,"abstract":"Results from neutron testing of the Xilinx Versal Prime adaptive compute acceleration platform (ACAP) are presented. The Xilinx Versal is an adaptive computing platform that is designed to do high-speed artificial intelligence calculations, which could be useful for deployed digital and image processing systems that need higher performance computing than radiation-hardened microprocessors but do not want to create a full field-programmable gate array (FPGA) design. The Versal VMK180 evaluation board was irradiated in August 2021 at LANSCE in the ICE House II flight path. This test shows that the FinFET transistors used in the Versal Prime are 10-1000 less sensitive to SEUs than other microprocessors, due to the 7 nm FintFET transistors and the use of error correcting codes. The SEFI sensitivity remains predominantly unchanged from previous generation parts.","PeriodicalId":202271,"journal":{"name":"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131232471","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
2022 REDW Reviewers
2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC) Pub Date : 2022-07-01 DOI: 10.1109/redw56037.2022.9921633
{"title":"2022 REDW Reviewers","authors":"","doi":"10.1109/redw56037.2022.9921633","DOIUrl":"https://doi.org/10.1109/redw56037.2022.9921633","url":null,"abstract":"","PeriodicalId":202271,"journal":{"name":"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)","volume":"68 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122913015","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Extended Compendium of Total Ionizing Dose (TID) Test Results for the Europa Clipper Mission 欧罗巴快船任务总电离剂量(TID)试验结果扩展纲要
2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC) Pub Date : 2022-07-01 DOI: 10.1109/REDW56037.2022.9921661
S. Zajac, Amanda N. Bozovich, Stacie Woo, R. Davies, B. Rax, Joe Davila, Duc Nguyen, Wilson P. Parker, A. Kenna, Jason L. Thomas
{"title":"Extended Compendium of Total Ionizing Dose (TID) Test Results for the Europa Clipper Mission","authors":"S. Zajac, Amanda N. Bozovich, Stacie Woo, R. Davies, B. Rax, Joe Davila, Duc Nguyen, Wilson P. Parker, A. Kenna, Jason L. Thomas","doi":"10.1109/REDW56037.2022.9921661","DOIUrl":"https://doi.org/10.1109/REDW56037.2022.9921661","url":null,"abstract":"Results of total ionizing dose (TID) tests and analysis on Electric, Electronic, and Electromechanical (EEE) parts, performed by the Jet Propulsion Laboratory in support of the Europa Clipper Mission.","PeriodicalId":202271,"journal":{"name":"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)","volume":"21 5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124457420","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Single Event Effects Characterization of Microchip Programmable Current Limiting Power Switch LX7712 微芯片可编程限流电源开关LX7712的单事件效应表征
2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC) Pub Date : 2022-07-01 DOI: 10.1109/REDW56037.2022.9921576
M. Leuenberger, Russell Stevens, N. Rezzak, Dorian Johnson
{"title":"Single Event Effects Characterization of Microchip Programmable Current Limiting Power Switch LX7712","authors":"M. Leuenberger, Russell Stevens, N. Rezzak, Dorian Johnson","doi":"10.1109/REDW56037.2022.9921576","DOIUrl":"https://doi.org/10.1109/REDW56037.2022.9921576","url":null,"abstract":"The heavy ions single event effect characterization results of Microchip Technology’s radiation-hardened programmable current limiting power switch IC, the LX7712, are presented. The data shown are based on single event campaign of September 2021.","PeriodicalId":202271,"journal":{"name":"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123884473","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Single Event Effects Susceptibilities of Select Commercial-Off-The-Shelf Components for Space 选择商用现成空间组件的单事件效应敏感性
2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC) Pub Date : 2022-07-01 DOI: 10.1109/REDW56037.2022.9921706
Daniel H. Lo, T. Tran
{"title":"Single Event Effects Susceptibilities of Select Commercial-Off-The-Shelf Components for Space","authors":"Daniel H. Lo, T. Tran","doi":"10.1109/REDW56037.2022.9921706","DOIUrl":"https://doi.org/10.1109/REDW56037.2022.9921706","url":null,"abstract":"This paper reports the results of single event effects (SEE) testing with heavy ions of commercial-off-the-shelf (COTS) electronic components considered for Class C/D space missions.","PeriodicalId":202271,"journal":{"name":"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)","volume":"140 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132019267","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Compendium of Current Heavy Ion Single-Event Effects Test Results for Candidate Electronics for NASA Johnson Space Center 美国宇航局约翰逊航天中心候选电子设备当前重离子单事件效应测试结果汇编
2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC) Pub Date : 2022-07-01 DOI: 10.1109/REDW56037.2022.9921663
Joshua M. Pritts, R. Gaza, C. Bailey, K. Nguyen
{"title":"Compendium of Current Heavy Ion Single-Event Effects Test Results for Candidate Electronics for NASA Johnson Space Center","authors":"Joshua M. Pritts, R. Gaza, C. Bailey, K. Nguyen","doi":"10.1109/REDW56037.2022.9921663","DOIUrl":"https://doi.org/10.1109/REDW56037.2022.9921663","url":null,"abstract":"We present radiation effects test results and analysis produced by NASA JSC in 2021 for candidate electronic components and devices. Devices tested include integrated circuits, MOSFETs, DC-DC converters, and various commercial solutions.","PeriodicalId":202271,"journal":{"name":"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128946120","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Neutron-Induced Single-Event Effects and Total Ionizing Dose in Embedded Radios 嵌入式无线电中中子诱导的单事件效应和总电离剂量
2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC) Pub Date : 2022-07-01 DOI: 10.1109/REDW56037.2022.9921485
E. Auden, M. Caffrey
{"title":"Neutron-Induced Single-Event Effects and Total Ionizing Dose in Embedded Radios","authors":"E. Auden, M. Caffrey","doi":"10.1109/REDW56037.2022.9921485","DOIUrl":"https://doi.org/10.1109/REDW56037.2022.9921485","url":null,"abstract":"Single-event effects, displacement damage, and total ionizing dose are characterized for a commercial-off-the-shelf embedded radio irradiated with neutrons and gamma rays. The radio’s radiation tolerance is investigated as part of an evaluation for possible spaceflight on short-term exploratory satellites.","PeriodicalId":202271,"journal":{"name":"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116173409","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Single Event Effect and Total Ionizing Dose Characterization of CAES 1.25 Gbps Repeater CAES 1.25 Gbps中继器的单事件效应和总电离剂量表征
2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC) Pub Date : 2022-07-01 DOI: 10.1109/REDW56037.2022.9921662
A. Turnbull, E. Serna, P. Nelson, M. Thun, J. Yount
{"title":"Single Event Effect and Total Ionizing Dose Characterization of CAES 1.25 Gbps Repeater","authors":"A. Turnbull, E. Serna, P. Nelson, M. Thun, J. Yount","doi":"10.1109/REDW56037.2022.9921662","DOIUrl":"https://doi.org/10.1109/REDW56037.2022.9921662","url":null,"abstract":"Single Event Latch-up (SEL), Single Event Transient and Total Ionizing Dose (TID) radiation characterization were performed on CAES UT54LVDS454 1.25 Gbps LVDS repeater. The device was shown to be suitable for space applications.","PeriodicalId":202271,"journal":{"name":"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)","volume":"380 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123243032","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Total-Ionizing-Dose Effects on Threshold Voltage Distribution of 64-Layer 3D NAND Memories 总电离剂量对64层三维NAND存储器阈值电压分布的影响
2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC) Pub Date : 2022-07-01 DOI: 10.1109/REDW56037.2022.9921459
Mondol Anik Kumar, M. Raquibuzzaman, Matchima Buddhanoy, M. Wasiolek, K. Hattar, T. Boykin, B. Ray
{"title":"Total-Ionizing-Dose Effects on Threshold Voltage Distribution of 64-Layer 3D NAND Memories","authors":"Mondol Anik Kumar, M. Raquibuzzaman, Matchima Buddhanoy, M. Wasiolek, K. Hattar, T. Boykin, B. Ray","doi":"10.1109/REDW56037.2022.9921459","DOIUrl":"https://doi.org/10.1109/REDW56037.2022.9921459","url":null,"abstract":"We measure total-ionizing-dose (TID) induced threshold voltage $left(V_{t}right)$ loss of a commercial 64-layer triple-level-cell (TLC) 3D NAND memory using user-mode commands. Our experiments show that Vt distributions closely follow Gaussian distributions. At increasing TID, the distributions shift toward lower average values and the distribution widths widen. We calculate exact cell Vt shifts from the pre-irradiation conditions at different TID values. We find that $V_{t} operatorname{loss}left(Delta V_{t}right)$ distributions also follow Gaussian distributions. We also find that $Delta V_{t}$ values strongly depend on the cell programmed states.","PeriodicalId":202271,"journal":{"name":"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)","volume":"100 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124600182","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
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