Single Event Effects Characterization of Microchip Programmable Current Limiting Power Switch LX7712

2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC) Pub Date : 2022-07-01 DOI:10.1109/REDW56037.2022.9921576

M. Leuenberger, Russell Stevens, N. Rezzak, Dorian Johnson

引用次数: 0

Abstract

The heavy ions single event effect characterization results of Microchip Technology’s radiation-hardened programmable current limiting power switch IC, the LX7712, are presented. The data shown are based on single event campaign of September 2021.

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微芯片可编程限流电源开关LX7712的单事件效应表征

介绍了Microchip Technology的抗辐射可编程限流电源开关IC LX7712的重离子单事件效应表征结果。所显示的数据是基于2021年9月的单事件活动。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)

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