美国宇航局约翰逊航天中心候选电子设备当前重离子单事件效应测试结果汇编

2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC) Pub Date : 2022-07-01 DOI:10.1109/REDW56037.2022.9921663

Joshua M. Pritts, R. Gaza, C. Bailey, K. Nguyen

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引用次数: 0

摘要

我们提出了NASA JSC在2021年对候选电子元件和设备进行的辐射效应测试结果和分析。测试的器件包括集成电路、mosfet、DC-DC转换器和各种商业解决方案。

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Compendium of Current Heavy Ion Single-Event Effects Test Results for Candidate Electronics for NASA Johnson Space Center

We present radiation effects test results and analysis produced by NASA JSC in 2021 for candidate electronic components and devices. Devices tested include integrated circuits, MOSFETs, DC-DC converters, and various commercial solutions.

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来源期刊

2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)

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