Neutron-Induced SEEs in the Xilinx Versal Prime

H. Quinn, C. Corley, P. Thelen
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引用次数: 2

Abstract

Results from neutron testing of the Xilinx Versal Prime adaptive compute acceleration platform (ACAP) are presented. The Xilinx Versal is an adaptive computing platform that is designed to do high-speed artificial intelligence calculations, which could be useful for deployed digital and image processing systems that need higher performance computing than radiation-hardened microprocessors but do not want to create a full field-programmable gate array (FPGA) design. The Versal VMK180 evaluation board was irradiated in August 2021 at LANSCE in the ICE House II flight path. This test shows that the FinFET transistors used in the Versal Prime are 10-1000 less sensitive to SEUs than other microprocessors, due to the 7 nm FintFET transistors and the use of error correcting codes. The SEFI sensitivity remains predominantly unchanged from previous generation parts.
Xilinx Versal Prime中的中子诱导see
介绍了Xilinx Versal Prime自适应计算加速平台(ACAP)的中子测试结果。Xilinx Versal是一种自适应计算平台,旨在进行高速人工智能计算,可用于部署数字和图像处理系统,这些系统需要比抗辐射微处理器更高的性能计算,但不希望创建完整的现场可编程门阵列(FPGA)设计。通用VMK180评估板于2021年8月在LANSCE的ICE House II飞行路径上进行了辐射。该测试表明,由于7nm FinFET晶体管和纠错码的使用,Versal Prime中使用的FinFET晶体管对seu的敏感性比其他微处理器低10-1000。SEFI灵敏度与上一代部件基本保持不变。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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