Yanran P. Chen, P. Maillard, Rama Devi Veggalam, Saraschandra Reddy Madem, Eric Crabill, Jeff Barton, M. Voogel
{"title":"64MeV Proton single-event evaluation of Xilinx Single Event Mitigation (XilSEM) firmware on 7nm Versal™ ACAP devices","authors":"Yanran P. Chen, P. Maillard, Rama Devi Veggalam, Saraschandra Reddy Madem, Eric Crabill, Jeff Barton, M. Voogel","doi":"10.1109/REDW56037.2022.9921508","DOIUrl":"https://doi.org/10.1109/REDW56037.2022.9921508","url":null,"abstract":"This paper presents the single-event upset (SEU) response of the Xilinx Soft Error Mitigation (XilSEM) firmware as applied to 7nm Versal ACAP. Migrated from the soft SEM IP, XilSEM is a firmware solution run on the platform management controller (PMC) to detect and correct single event upsets (SEU) in configuration memory (CRAM) of 7nm AMD-Xilinx FPGAs. Moreover, XilSEM also scans and detects any corruptions in 7nm Versal Network-on-chip Peripheral Interface (NPI) configuration bits. Data obtained from accelerated test using a 64MeV monoenergetic proton source is compared to control static readback test data in order to evaluate the XilSEM capability to detect and correct SEU. Results show that 100% of events are detected and zero XilSEM SEFIs are observed in Proton environment.","PeriodicalId":202271,"journal":{"name":"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127690622","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
R. Gooty, G. Modi, S. Williams, K. Kruckmeyer, V. Salomon, D. Boldrin
{"title":"Radiation Evaluation of the DP83561-SP Radiation Hardened 10/100/1000 Ethernet PHY Transceiver with SEFI Handling Sub-System.","authors":"R. Gooty, G. Modi, S. Williams, K. Kruckmeyer, V. Salomon, D. Boldrin","doi":"10.1109/REDW56037.2022.9921702","DOIUrl":"https://doi.org/10.1109/REDW56037.2022.9921702","url":null,"abstract":"High reliability gigabit ethernet PHY designed for the high-radiation environment with SEFI handling Sub-System radiation effects are evaluated.","PeriodicalId":202271,"journal":{"name":"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)","volume":"86 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123601246","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Debugging Xilinx Zynq-7000 SoC Processor Caches during Linux System Execution under Proton Irradiation","authors":"M. Jaksch, J. Budroweit, F. Stehle","doi":"10.1109/REDW56037.2022.9921631","DOIUrl":"https://doi.org/10.1109/REDW56037.2022.9921631","url":null,"abstract":"Caches are vitally important for the performance in modern CPUs. But they also bear great potential for malfunction when put under irradiation. Hence, trade-offs have to be made for either performance or reliability.In this paper we present a deeper insight on the CPU caches, their influence in a running operating system and possible reasons for their malfunction. Therefore, a proton source with 230 MeV was used to target an ARM Cortex A9 in a Zynq-7000, running an embedded Linux with KGDB. As a result, we tested three different cache configurations, which showed three distinct error cases. This can help to improve the understanding of system malfunctions due to radiation and build useful mitigation techniques.","PeriodicalId":202271,"journal":{"name":"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)","volume":"49 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127968224","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}