64MeV Proton single-event evaluation of Xilinx Single Event Mitigation (XilSEM) firmware on 7nm Versal™ ACAP devices

Abstract

This paper presents the single-event upset (SEU) response of the Xilinx Soft Error Mitigation (XilSEM) firmware as applied to 7nm Versal ACAP. Migrated from the soft SEM IP, XilSEM is a firmware solution run on the platform management controller (PMC) to detect and correct single event upsets (SEU) in configuration memory (CRAM) of 7nm AMD-Xilinx FPGAs. Moreover, XilSEM also scans and detects any corruptions in 7nm Versal Network-on-chip Peripheral Interface (NPI) configuration bits. Data obtained from accelerated test using a 64MeV monoenergetic proton source is compared to control static readback test data in order to evaluate the XilSEM capability to detect and correct SEU. Results show that 100% of events are detected and zero XilSEM SEFIs are observed in Proton environment.