{"title":"选择商用现成空间组件的单事件效应敏感性","authors":"Daniel H. Lo, T. Tran","doi":"10.1109/REDW56037.2022.9921706","DOIUrl":null,"url":null,"abstract":"This paper reports the results of single event effects (SEE) testing with heavy ions of commercial-off-the-shelf (COTS) electronic components considered for Class C/D space missions.","PeriodicalId":202271,"journal":{"name":"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)","volume":"140 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Single Event Effects Susceptibilities of Select Commercial-Off-The-Shelf Components for Space\",\"authors\":\"Daniel H. Lo, T. Tran\",\"doi\":\"10.1109/REDW56037.2022.9921706\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper reports the results of single event effects (SEE) testing with heavy ions of commercial-off-the-shelf (COTS) electronic components considered for Class C/D space missions.\",\"PeriodicalId\":202271,\"journal\":{\"name\":\"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)\",\"volume\":\"140 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/REDW56037.2022.9921706\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW56037.2022.9921706","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Single Event Effects Susceptibilities of Select Commercial-Off-The-Shelf Components for Space
This paper reports the results of single event effects (SEE) testing with heavy ions of commercial-off-the-shelf (COTS) electronic components considered for Class C/D space missions.