M. Leuenberger, Russell Stevens, N. Rezzak, Dorian Johnson
{"title":"微芯片可编程限流电源开关LX7712的单事件效应表征","authors":"M. Leuenberger, Russell Stevens, N. Rezzak, Dorian Johnson","doi":"10.1109/REDW56037.2022.9921576","DOIUrl":null,"url":null,"abstract":"The heavy ions single event effect characterization results of Microchip Technology’s radiation-hardened programmable current limiting power switch IC, the LX7712, are presented. The data shown are based on single event campaign of September 2021.","PeriodicalId":202271,"journal":{"name":"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Single Event Effects Characterization of Microchip Programmable Current Limiting Power Switch LX7712\",\"authors\":\"M. Leuenberger, Russell Stevens, N. Rezzak, Dorian Johnson\",\"doi\":\"10.1109/REDW56037.2022.9921576\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The heavy ions single event effect characterization results of Microchip Technology’s radiation-hardened programmable current limiting power switch IC, the LX7712, are presented. The data shown are based on single event campaign of September 2021.\",\"PeriodicalId\":202271,\"journal\":{\"name\":\"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)\",\"volume\":\"38 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/REDW56037.2022.9921576\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW56037.2022.9921576","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Single Event Effects Characterization of Microchip Programmable Current Limiting Power Switch LX7712
The heavy ions single event effect characterization results of Microchip Technology’s radiation-hardened programmable current limiting power switch IC, the LX7712, are presented. The data shown are based on single event campaign of September 2021.