使用质子辐照的Intel Movidius Myriad X VPU和Google Edge TPU加速器的单事件扰动特性

2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC) Pub Date : 2022-07-01 DOI:10.1109/REDW56037.2022.9921608

Devin P. Ramaswami, D. Hiemstra, Zhi Yang, S. Shi, L. Chen

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引用次数: 1

摘要

介绍了Movidius Myriad X VPU和Google Edge TPU的质子诱导SEU截面。对空间辐射环境的扰动率进行了估计，发现低轨道任务可以接受。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Single Event Upset Characterization of the Intel Movidius Myriad X VPU and Google Edge TPU Accelerators Using Proton Irradiation

Proton induced SEU cross-sections of the Movidius Myriad X VPU and Google Edge TPU are presented. Upset rates in the space radiation environment are estimated and found to be acceptable for low orbit missions.

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来源期刊

2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)

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