Radiation Characterization Results of AP54RHC 30 krad(Si) Logic Family

Abstract

This paper details the Total Ionizing Dosage (TID), Single Event Latchup (SEL), and Single Event Transient (SET) characterization results for Apogee Semiconductor’s AP54RHC logic family. Results for TID up to 45krad (Si) and Single Event Effects (SEE) at a maximum LE$\text{T}_{EFF}=74.7 \text{MeV}\cdot \text{cm}^{2}$/mg are presented. The paper also presents SEE event rate calculations for LEO and GEO space applications using upper limit cross-sections with a 95% confidence interval. These results demonstrate that this device family is well suited for space applications.