Laser Techniques for Mitigation of Single Event Effects in a PWM Controller

Abstract

In this paper, we present the results of the Buck PWM Controller Single Event Functional Interrupts (SEFI) on the initial silicon, and the efforts to discover root cause of the SEFI/SET through diagnostic testing, design simulations, and laser testing. This helped improve the results on revised silicon in significantly reducing the SEFI/SET cross-section. The Buck PWM Controller is designed on a 250nm CMOS process using Radiation Hardened circuit design and layout techniques.