Proceedings International Test Conference 1997最新文献_第8页

Tree-structured linear cellular automata and their applications as PRPGs 树结构线性元胞自动机及其在prpg中的应用

Proceedings International Test Conference 1997 Pub Date : 1997-11-01 DOI: 10.1109/TEST.1997.639700

J. Li, X. Sun, K. Soon

引用次数: 12

Addressing early design-for-test synthesis in a production environment 在生产环境中处理早期的为测试而设计的合成

Proceedings International Test Conference 1997 Pub Date : 1997-11-01 DOI: 10.1109/TEST.1997.639620

V. Chickermane, K. Zarrineh

引用次数: 14

Fault model extension for diagnosing custom cell fails 故障模型扩展，用于诊断自定义单元故障

Proceedings International Test Conference 1997 Pub Date : 1997-11-01 DOI: 10.1109/TEST.1997.639670

G. Vandling, Thomas Bartenstein

引用次数: 1

Diagnosis of bridging faults in sequential circuits using adaptive simulation, state storage, and path-tracing 时序电路中使用自适应仿真、状态存储和路径跟踪的桥接故障诊断

Proceedings International Test Conference 1997 Pub Date : 1997-11-01 DOI: 10.1109/TEST.1997.639702

S. Venkataraman, W. Fuchs

引用次数: 6

Hierarchical specification-driven analog fault modeling for efficient fault simulation and diagnosis 分层规范驱动的模拟故障建模，实现高效的故障仿真与诊断

Proceedings International Test Conference 1997 Pub Date : 1997-11-01 DOI: 10.1109/TEST.1997.639705

R. Voorakaranam, S. Chakrabarti, J. Hou, A. Gomes, S. Cherubal, A. Chatterjee, W. Kao

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引用次数: 53

Why automate optical inspection? 为什么要自动化光学检测?

Proceedings International Test Conference 1997 Pub Date : 1997-11-01 DOI: 10.1109/TEST.1997.639723

D. Raymond, Dominic F. Haigh

引用次数: 10

i/sub DD/ pulse response testing applied to complex CMOS ICs i/sub DD/脉冲响应测试应用于复杂的CMOS芯片

Proceedings International Test Conference 1997 Pub Date : 1997-11-01 DOI: 10.1109/TEST.1997.639591

J. Beasley, S. Pour-Mozafari, D. Huggett, A. Righter, C. J. Apodaca

引用次数: 18

High-performance production test contactors for fine-pitch integrated circuit 用于细间距集成电路的高性能生产测试接触器

Proceedings International Test Conference 1997 Pub Date : 1997-11-01 DOI: 10.1109/TEST.1997.639658

James J. Brandes

引用次数: 5

A symbolic simulation-based ANSI/IEEE Std 1149.1 compliance checker and BSDL generator 基于符号仿真的ANSI/IEEE Std 1149.1符合性检查器和BSDL生成器

Proceedings International Test Conference 1997 Pub Date : 1997-11-01 DOI: 10.1109/TEST.1997.639621

Harbinder Singh, James Beausang, Girish Patankar

引用次数: 9

Using BIST control for pattern generation 使用BIST控制模式生成

Proceedings International Test Conference 1997 Pub Date : 1997-11-01 DOI: 10.1109/TEST.1997.639636

G. Kiefer, H. Wunderlich

引用次数: 50