{"title":"基于符号仿真的ANSI/IEEE Std 1149.1符合性检查器和BSDL生成器","authors":"Harbinder Singh, James Beausang, Girish Patankar","doi":"10.1109/TEST.1997.639621","DOIUrl":null,"url":null,"abstract":"The paper shows how to extract the boundary-scan circuitry from an IC (Integrated Circuit), verify its compliance to IEEE Std 1149.1 and generate its BSDL (Boundary Scan Description Language) description. This work applies to the 75% of boundary-scan ICs that have hand-generated or macro-cell based boundary-scan circuity. It also applies to boundary-scan ICs designed using RTL (Register Transfer Level) synthesis.","PeriodicalId":186340,"journal":{"name":"Proceedings International Test Conference 1997","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"A symbolic simulation-based ANSI/IEEE Std 1149.1 compliance checker and BSDL generator\",\"authors\":\"Harbinder Singh, James Beausang, Girish Patankar\",\"doi\":\"10.1109/TEST.1997.639621\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper shows how to extract the boundary-scan circuitry from an IC (Integrated Circuit), verify its compliance to IEEE Std 1149.1 and generate its BSDL (Boundary Scan Description Language) description. This work applies to the 75% of boundary-scan ICs that have hand-generated or macro-cell based boundary-scan circuity. It also applies to boundary-scan ICs designed using RTL (Register Transfer Level) synthesis.\",\"PeriodicalId\":186340,\"journal\":{\"name\":\"Proceedings International Test Conference 1997\",\"volume\":\"36 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings International Test Conference 1997\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1997.639621\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings International Test Conference 1997","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1997.639621","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A symbolic simulation-based ANSI/IEEE Std 1149.1 compliance checker and BSDL generator
The paper shows how to extract the boundary-scan circuitry from an IC (Integrated Circuit), verify its compliance to IEEE Std 1149.1 and generate its BSDL (Boundary Scan Description Language) description. This work applies to the 75% of boundary-scan ICs that have hand-generated or macro-cell based boundary-scan circuity. It also applies to boundary-scan ICs designed using RTL (Register Transfer Level) synthesis.